1、Designation:E244615Standard Practice forManufacturing Characterization of Computed RadiographySystems1This standard is issued under the fixed designation E2446;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the year of last revision
2、.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.1.Scope1.1 This practice describes the manufacturing characteriza-tion of computed radiography(CR)systems,consisting of aparticular phosphor imagin
3、g plate(IP),scanner,software,andan image display monitor,in combination with specified metalscreens for industrial radiography.1.2 The practice defines system tests to be used to charac-terize the systems of different suppliers and make themcomparable for users.1.3 This practice is intended for use
4、by manufacturers of CRsystems or certification agencies to provide quantitative resultsof CR system characteristics for nondestructive testing(NDT)user or purchaser consumption.Some of these tests requirespecialized test phantoms to ensure consistency of resultsamong suppliers or manufacturers.These
5、 tests are not intendedfor users to complete,nor are they intended for long termstability tracking and lifetime measurements.However,theymay be used for this purpose,if so desired.1.4 The CR system performance is described by the basicspatial resolution,contrast,signal and noise parameters,andthe eq
6、uivalent penetrameter sensitivity(EPS).Some of theseparameters are used to compare with DDAcharacterization andfilm characterization data(see Practice E2597 and Test MethodE1815).NOTE1For film system characterization,the signal is represented bythe optical density of 2(above fog and base)and the noi
7、se as granularity.The signal-to-noise ratio is normalized by the aperture(similar to the basicspatial resolution)of the system and is part of characterization.Thisnormalization is given by the scanning circular aperture of 100 m of themicro-photometer,which is defined in Test Method E1815 for film s
8、ystemcharacterization.1.5 The measurement of CR systems in this practice isrestricted to a selected radiation quality to simplify the proce-dure.The properties of CR systems will change with radiationenergy but not the ranking of CR system performance.Users ofthis practice may carry out the tests at
9、 different or additionalradiation qualities(X-ray or gamma ray)if required.1.6 The values stated in SI are to be regarded as thestandard.1.7 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to esta
10、blish appro-priate safety and health practices and to determine theapplicability of regulatory limitations prior to use.2.Referenced Documents2.1 ASTM Standards:2E746 Practice for Determining Relative Image Quality Re-sponse of Industrial Radiographic Imaging SystemsE1165 Test Method for Measurement
11、 of Focal Spots ofIndustrial X-Ray Tubes by Pinhole ImagingE1316 Terminology for Nondestructive ExaminationsE1815 Test Method for Classification of Film Systems forIndustrial RadiographyE2002 Practice for Determining Total Image Unsharpnessand Basic Spatial Resolution in Radiography and Radios-copyE
12、2007 Guide for Computed RadiographyE2033 Practice for Computed Radiology(PhotostimulableLuminescence Method)E2445 Practice for Performance Evaluation and Long-TermStability of Computed Radiography SystemsE2597 Practice for Manufacturing Characterization of Digi-tal Detector ArraysE2903 Test Method f
13、or Measurement of the Effective FocalSpot Size of Mini and Micro Focus X-ray Tubes2.2 ISO Standard:3ISO17636-2 Non-DestructiveTestingofWeldsRadiographic TestingPart 2:X-and Gamma Ray Tech-nologies with Digital Detectors1This practice is under the jurisdiction of ASTM Committee E07 on Nonde-structive
14、 Testing and is the direct responsibility of Subcommittee E07.01 onRadiology(X and Gamma)Method.Current edition approved July 1,2015.Published November 2015.Originallyapproved in 2005.Last previous edition approved in 2010 as E2446 05(2010).DOI:10.1520/E2446-15.2For referenced ASTM standards,visit t
15、he ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page onthe ASTM website.3Available from International Organization for Standardization(ISO),1,ch.dela Voie-Creuse,CP 56,CH-1211
16、Geneva 20,Switzerland,http:/www.iso.org.Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 3.Terminology3.1 DefinitionsThe definition of terms relating to gamma-and X-radiography,which appear in Terminology E1316,Guide E2007,and Practice E2033,shall apply to the terms usedin this practice.3.2 Definitions of Terms Specific to This Standard:3.2.1 computed radiography system(CR system)A com-plete system of a storage phosphor imaging plate(I