1、Designation:D 1389 97aAn American National StandardStandard Test Method forProof-Voltage Testing of Thin Solid Electrical InsulatingMaterials1This standard is issued under the fixed designation D 1389;the number immediately following the designation indicates the year oforiginal adoption or,in the c
2、ase of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon(e)indicates an editorial change since the last revision or reapproval.1.Scope1.1 This test method covers a general procedure for proof-voltage testing of thin solid electrical
3、 insulating materials atcommercial power frequencies.It is intended to apply princi-pally to flat materials but is applicable,with modification,toany form that permits continuously passing the materialbetween suitable electrodes.2,31.2 On extremely thin materials(usually less than 0.05 mm(0.002 in.)
4、the test results may be influenced more bymechanical damage caused by conditions of test than bydielectric defects.Consequently,this test method is not recom-mended for use with extremely thin materials,unless priordetermination has established that the test results are notinfluenced by mechanical d
5、amage.1.3 While the equipment and procedures described in thistest method relate specifically to tests made with powerfrequency ac voltages,similar equipment and procedures areused for proof-voltage tests using dc voltages.To the extentthat it applies to dc tests,this test method can serve as a guid
6、efor persons making such tests.However,only tests made withpower frequency ac voltages can be said to be in accordancewith this test method.1.4 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to e
7、stablish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.For specific hazardstatements,see Section 7.2.Referenced Documents2.1 ASTM Standards:D 149 Test Method for Dielectric Breakdown Voltage andDielectric Strength of Solid Electrical
8、 Insulating Materialsat Commercial Power Frequencies43.Terminology3.1 Definitions:3.1.1 proof voltage test,na test during which a specifiedvoltage is applied to a specimen to determine whether break-down will occur at that voltage.Fixed electrodes may be used,in which case the voltage is held for a
9、specified time;or largearea specimens may pass between roller,brush,or bladeelectrodes,in which case the speed is specified.4.Summary of Test Method4.1 In this test method,sheet insulating material is passed ata specified speed between roller electrodes with a specified acvoltage applied,so that all
10、,or nearly all,of the area of thematerial is subjected to the specified voltage.The number ofelectrical breakdowns and their locations are determined.4.2 The applied proof voltage may be selected as a percent-age of the dielectric breakdown voltage,as determined inaccordance with Test Method D 149,o
11、r as a multiple of thebreakdown voltage for an air gap of equal thickness.4.3 Unless the material being tested is known to have highresistance to partial discharges,the proof voltage is ordinarilyselected to be below the visible corona level.If it is necessaryto test at a voltage at which visible co
12、rona will be present,thedegradation of the material resulting from exposure to coronashould be weighed against the advantages of testing at the highvoltage level.4.4 Two values for the rate of movement of the materialbetween the electrodes are given to facilitate handling ofdifferent types of materi
13、als.The results obtained with thedifferent speeds are not equivalent.5.Significance and Use5.1 Occasional dielectric defects may be found in commer-cially available and acceptable thin electric insulating materi-als.More often than not,these materials are used in multiplelayers.The probability that
14、occasional dielectric weak spots1This test method is under the jurisdiction of ASTM Committee D-9 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.12 on Electrical Tests.Current edition approved Sept.10,1997.Published January 1998.Originallypublish
15、ed as D 1389 56 T.Last previous edition D 1389 97.2Bartnikas,R.,Chapter 3,“High Voltage Measurements,”Electrical Propertiesof Solid Insulating Materials,Measurement Techniques,Vol.IIB,EngineeringDielectrics,R.Bartnikas,Editor,ASTM STP 926,ASTM,Philadelphia,1987.3Nelson,J.K.,Chapter 5,“Dielectric Bre
16、akdown of Solids,”ElectricalProperties of Solid Insulating Materials:Molecular Structure and ElectricalBehavior,Vol.IIA,Engineering Dielectrics,R.Bartnikas and R.M.Eichorn,Editors,ASTM STP 783,ASTM,Philadelphia,1983.4Annual Book of ASTM Standards,Vol 10.01.1Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959,United States.will coincide from layer to layer is very small but increaseswith the frequency of occurrence of these defects.The proof-voltage test