1、Designation:F744M16Standard Test Method forMeasuring Dose Rate Threshold for Upset of DigitalIntegrated Circuits(Metric)1This standard is issued under the fixed designation F744M;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the ye
2、ar of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.This standard has been approved for use by agencies of the U.S.Department of Defense.1.Scope1.1 This test method covers the meas
3、urement of the thresh-old level of radiation dose rate that causes upset in digitalintegrated circuits only under static operating conditions.Theradiation source is either a flash X-ray machine(FXR)or anelectron linear accelerator(LINAC).1.2 The precision of the measurement depends on thehomogeneity
4、 of the radiation field and on the precision of theradiation dosimetry and the recording instrumentation.1.3 The test may be destructive either for further tests or forpurposes other than this test if the integrated circuit beingtested absorbs a total radiation dose exceeding some predeter-mined lev
5、el.Because this level depends both on the kind ofintegrated circuit and on the application,a specific value mustbe agreed upon by the parties to the test(6.8).1.4 Setup,calibration,and test circuit evaluation proceduresare included in this test method.1.5 Procedures for lot qualification and samplin
6、g are notincluded in this test method.1.6 Because of the variability of the response of differentdevice types,the initial dose rate and device upset conditionsfor any specific test is not given in this test method but must beagreed upon by the parties to the test.1.7 The values stated in SI units ar
7、e to be regarded asstandard.No other units of measurement are included in thisstandard.1.8 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and
8、 determine the applica-bility of regulatory limitations prior to use.2.Referenced Documents2.1 ASTM Standards:2E666 Practice for Calculating Absorbed Dose From Gammaor X RadiationE668 Practice for Application of Thermoluminescence-Dosimetry(TLD)Systems for Determining AbsorbedDose in Radiation-Hardn
9、ess Testing of Electronic DevicesE1894 Guide for Selecting Dosimetry Systems for Applica-tion in Pulsed X-Ray SourcesF526 Test Method for Using Calorimeters for Total DoseMeasurements in Pulsed Linear Accelerator or FlashX-ray Machines3.Terminology3.1 Definitions:3.1.1 combinatorial logic circuitint
10、egrated circuit whoseoutput is a unique function of the inputs;the output changes ifand only if the input changes(for example,AND-andOR-gates).3.1.2 dose rateenergy absorbed per unit time and per unitmass by a given material from the radiation to which it isexposed.3.1.3 dose rate threshold for upse
11、tminimum dose rate thatcauses either:(1)the instantaneous output voltage of anoperating digital integrated circuit to be greater than thespecified maximum LOW value(for a LOW output level)orless than the specified minimum HIGH value(for a HIGHoutput level),or(2)a change of state of any stored data.3
12、.1.4 sequential logic circuitintegrated circuit whose out-put or internal operating conditions are not unique functions ofthe inputs(for example,flip-flops,shift registers,and RAMs).4.Summary of Test Method4.1 The test device and suitable dosimeters are irradiated byeither an FXR or a linac.The test
13、 device is operating but under1This test method is under the jurisdiction of ASTM Committee F01 onElectronics and is the direct responsibility of Subcommittee F01.11 on Nuclear andSpace Radiation Effects.Current edition approved May 1,2016.Published May 2016.Originallyapproved in 1981.Last previous
14、edition approved in 2010 as F744M 10.DOI:10.1520/F0744M-16.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page onthe ASTM website.Copyrig
15、ht ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 static conditions.The output(s)of the test device and of thedosimeters are recorded.4.2 The dose rate is varied to determine the rate whichresults in upset of the test device.4.3 For the purposes o
16、f this test method,upset is consideredto be either of the following:4.3.1 An output voltage transient exceeding a predeter-mined value,or4.3.2 For devices having output logic levels which are notunique functions of the input logic levels,such as flip-flops,achange in the logic state of an output.4.3.3 For sequential logic circuits,a change of state of aninternal storage element or node.4.4 A number of factors are not defined in this test method,and must be agreed upon beforehand by the parties t