1、 INTERNATIONAL STANDARD IEC61164 Second edition2004-03 Reliability growth Statistical test and estimation methods Reference number IEC 61164:2004(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.Publication numberingAs from 1 January
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8、ON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.INTERNATIONAL STANDARD IEC61164 Second edition2004-03 Reliability growth Statistical test and estimation methods IEC 2004 Copyright-all rights reserved No part of this publication may be reproduced or u
9、tilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechnical Commission,3,rue de Varemb,PO Box 131,CH-1211 Geneva 20,SwitzerlandTelephone:+41 22 919 02 11 Telefax:+41 22 919 03 00 E-m
10、ail:inmailiec.ch Web:www.iec.ch XA For price,see current cataloguePRICE CODE Commission Electrotechnique InternationaleInternational Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 61164 IEC:2004(E)CONTENT
11、S FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.7 3 Terms and definitions.7 4 Symbols.8 5 Reliability growth models in design and test.12 6 Reliability growth models used for systems/products in design phase.13 6.1 Modified power law model for planning of reliability growth in product d
12、esign phase.13 6.2 Modified Bayesian IBM-Rosner model for planning reliability growth in design phase.16 7 Reliability growth planning a tracking in the product reliability growth testing.18 7.1 Continuous reliability growth models.18 7.2 Discrete reliability growth model.20 8 Use of the power law m
13、odel in planning reliability improvement test programmes.23 9 Statistical test and estimation procedures for continuous power law model.23 9.1 Overview.23 9.2 Growth tests and parameter estimation.23 9.3 Goodness-of-fit tests.27 9.4 Confidence intervals on the shape parameter.29 9.5 Confidence inter
14、vals on current MTBF.31 9.6 Projection technique.33 Annex A(informative)Examples for planning and analytical models used in design and test phase of product development.37 Annex B(informative)The power law reliability growth model Background information.50 Bibliography.55 Figure 1 Planned improvemen
15、t of the average failure rate or reliability.12 Figure A.1 Planned and achieved reliability growth Example.40 Figure A.2 Planned reliability growth using Bayesian reliability growth model.41 Figure A.3 Scatter diagram of expected and observed test times at failure based on data of Table A.2 with pow
16、er law model.48 Figure A.4 Observed and estimated accumulated failures/accumulated test time based on data of Table A.2 with power law model.49 Table 1 Categories of reliability growth models with clause references.13 Table 2 Critical values for Cramr-von Mises goodness-of-fit test at 10%level of significance.34 Table 3 Two-sided 90%confidence intervals for MTBF from Type I testing.35 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU