1、 IEC 62860 Edition 1.0 2013-08 INTERNATIONAL STANDARD Test methods for the characterization of organic transistors and materials IEC 62860:2013(E)IEEE Std.1620-2008 IEEE Std 1620 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-27-2014 by James Madison.N
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10、erial licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 62860 Edition 1.0 2013-08 INTERNATIONAL STANDARD Test methods for the characterization of organic transistors an
11、d materials INTERNATIONAL ELECTROTECHNICAL COMMISSION T ICS 07.030 PRICE CODE ISBN 978-2-8322-1014-7 Warning!Make sure that you obtained this publication from an authorized distributor.IEEE Std 1620 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-27-201
12、4 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.ii IEC 62860:2013(E)IEEE Std 1620-2008 Published by IEC under license from IEEE.2008 IEEE.All rights reserved.Contents 1.Overview.1 1.1 Scope.1 1.2 Purpose.1 1.3 Electrical characterization overview.2 2
13、.Definitions,acronyms,and abbreviations.3 2.1 Definitions.3 2.2 Acronyms and abbreviations.6 3.Standard OFET characterization procedures.6 3.1 Device structures.6 3.2 Guidelines for the OFET characterization process.7 3.3 Electrical standards.8 3.4 Reporting data.11 3.5 Environmental control and sta
14、ndards.13 Annex A(informative)Bibliography.14 Annex B(informative)IEEE List of Participants.15 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 62
15、860:2013(E)iii IEEE Std 1620-2008 Published by IEC under license from IEEE.2008 IEEE.All rights reserved.TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS FOREWORD 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising
16、all national electrotechnical committees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields.To this end and in addition to other activities,IEC publishes International Standards,Technical Specifications,Technical Reports,Publicly Available Specifications(PAS)and Guides(hereafter referred to as“IEC Publication(s)”).Their preparation is entrusted to technical committees;any IEC