1、Designation:E124915Standard Practice forMinimizing Dosimetry Errors in Radiation Hardness Testingof Silicon Electronic Devices Using Co-60 Sources1This standard is issued under the fixed designation E1249;the number immediately following the designation indicates the year oforiginal adoption or,in t
2、he case of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.This standard has been approved for use by agencies of the U.S.Department of Defense.1.Scope1.1 This p
3、ractice covers recommended procedures for theuse of dosimeters,such as thermoluminescent dosimeters(TLDs),to determine the absorbed dose in a region of interestwithin an electronic device irradiated using a Co-60 source.Co-60 sources are commonly used for the absorbed dosetesting of silicon electron
4、ic devices.NOTE1This absorbed-dose testing is sometimes called“total dosetesting”to distinguish it from“dose rate testing.”NOTE2The effects of ionizing radiation on some types of electronicdevices may depend on both the absorbed dose and the absorbed dose rate;that is,the effects may be different if
5、 the device is irradiated to the sameabsorbed-dose level at different absorbed-dose rates.Absorbed-dose rateeffects are not covered in this practice but should be considered inradiation hardness testing.1.2 The principal potential error for the measurement ofabsorbed dose in electronic devices arise
6、s from non-equilibrium energy deposition effects in the vicinity of materialinterfaces.1.3 Information is given about absorbed-dose enhancementeffects in the vicinity of material interfaces.The sensitivity ofsuch effects to low energy components in the Co-60 photonenergy spectrum is emphasized.1.4 A
7、 brief description is given of typical Co-60 sourceswith special emphasis on the presence of low energy compo-nents in the photon energy spectrum output from such sources.1.5 Procedures are given for minimizing the low energycomponents of the photon energy spectrum from Co-60sources,using filtration
8、.The use of a filter box to achieve suchfiltration is recommended.1.6 Information is given on absorbed-dose enhancementeffects that are dependent on the device orientation with respectto the Co-60 source.1.7 The use of spectrum filtration and appropriate deviceorientation provides a radiation enviro
9、nment whereby theabsorbed dose in the sensitive region of an electronic devicecan be calculated within defined error limits without detailedknowledge of either the device structure or of the photonenergy spectrum of the source,and hence,without knowing thedetails of the absorbed-dose enhancement eff
10、ects.1.8 The recommendations of this practice are primarilyapplicable to piece-part testing of electronic devices.Elec-tronic circuit board and electronic system testing may intro-duce problems that are not adequately treated by the methodsrecommended here.1.9 This standard does not purport to addre
11、ss all of thesafety problems,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2.Referenced Documents2.1 ASTM Standards:2E170 Terminology Re
12、lating to Radiation Measurements andDosimetryE666 Practice for Calculating Absorbed Dose From Gammaor X RadiationE668 Practice for Application of Thermoluminescence-Dosimetry(TLD)Systems for Determining AbsorbedDose in Radiation-Hardness Testing of Electronic DevicesE1250 Test Method for Application
13、 of Ionization Chambersto Assess the Low Energy Gamma Component of1This practice is under the jurisdiction of ASTM Committee E10 on NuclearTechnology and Applicationsand is the direct responsibility of SubcommitteeE10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices.Current e
14、dition approved June 1,2015.Published July 2015.Originally approvedin 1988.Last previous edition approved in 2010 as E124910.DOI:10.1520/E1249-15.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards vol
15、ume information,refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 Cobalt-60 Irradiators Used in Radiation-Hardness Testingof Silicon Electronic Devices2.2 International Commiss
16、ion on Radiation Units and Mea-surements Reports:ICRU Report 14 Radiation Dosimetry:X-Rays and GammaRays With Maximum Photon Energies Between 0.6 and50 MeV3ICRU Report 18 Specification of HighActivity Gamma-RaySources33.Terminology3.1 absorbermaterial that reduces the photon fluence ratefrom a Co-60 source by any interaction mechanism.3.2 absorbed-dose enhancementincrease(or decrease)inthe absorbed dose(as compared to the equilibrium absorbeddose)at a point in a material of interest.This can be
