1、Designation:E2597/E2597M14Standard Practice forManufacturing Characterization of Digital Detector Arrays1This standard is issued under the fixed designation E2597/E2597M;the number immediately following the designation indicates the yearof original adoption or,in the case of revision,the year of las
2、t revision.A number in parentheses indicates the year of last reapproval.A superscript epsilon()indicates an editorial change since the last revision or reapproval.1.Scope1.1 This practice describes the evaluation of Digital Detec-tor Arrays(DDAs),and assures that one common standardexists for quant
3、itative comparison of DDAs so that an appro-priate DDA is selected to meet NDT requirements.1.2 This practice is intended for use by manufacturers orintegrators of DDAs to provide quantitative results of DDAcharacteristics for NDT user or purchaser consumption.Someof these tests require specialized
4、test phantoms to assureconsistency among results among suppliers or manufacturers.These tests are not intended for users to complete,nor are theyintended for long term stability tracking and lifetime measure-ments.However,they may be used for this purpose,if sodesired.1.3 The results reported based
5、on this standard should bebased on a group of at least three individual detectors for aparticular model number.1.4 The values stated in either SI units or inch-pound unitsare to be regarded separately as standard.The values stated ineach system may not be exact equivalents;therefore,eachsystem shall
6、 be used independently of the other.Combiningvalues from the two systems may result in non-conformancewith the standard.1.5 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priat
7、e safety and health practices and determine the applica-bility of regulatory limitations prior to use.2.Referenced Documents2.1 ASTM Standards:2E1316 Terminology for Nondestructive ExaminationsE1815 Test Method for Classification of Film Systems forIndustrial RadiographyE2002 Practice for Determinin
8、g Total Image Unsharpness inRadiologyE2445 Practice for Performance Evaluation and Long-TermStability of Computed Radiography SystemsE2446 Practice for Classification of Computed RadiologySystems2.2 Other Standards:ISO 7004 PhotographyIndustrial Radiographic FilmsDetermination of ISO Speed,ISO Avera
9、ge Gradient andISO Gradients G2 and G4 When Exposed to X-andGamma-Radiation3IEC 62220-1 Medical Electrical Equipment Characteristicsof Digital X-ray Imaging Devices Part 1:Determination ofthe Detective Quantum Efficiency43.Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 achievabl
10、e contrast sensitivity(CSa)optimum con-trast sensitivity(see Terminology E1316 for a definition ofcontrast sensitivity)obtainable using a standard phantom withan X-ray technique that has little contribution from scatter.3.1.2 active DDA areathe size and location of the DDA,which is recommended by th
11、e manufacturer as usable.3.1.3 bad pixela pixel identified with a performanceoutside of the specification range for a pixel of a DDA asdefined in 6.2.3.1.4 burn-inchange in gain of the scintillator that persistswell beyond the exposure.3.1.5 calibrationcorrection applied for the offset signal,and th
12、e non-uniformity of response of any or all of the X-raybeam,scintillator and the read-out structure.3.1.6 contrast-to-noise ratio(CNR)quotient of the differ-ence of the mean signal levels between two image areas and thestandard deviation of the signal levels.As applied here,the twoimage areas are th
13、e step-wedge groove and base material.The1This practice is under the jurisdiction of ASTM Committee E07 on Nonde-structive Testing and is the direct responsibility of Subcommittee E07.01 onRadiology(X and Gamma)Method.Current edition approved Jan.1,2014.Published February 2014.Originallyapproved in
14、2007.Last previous edition approved in 2007 as E2597-071.DOI:10.1520/E2597_E2597M-14.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page
15、onthe ASTM website.3Available from American National Standards Institute(ANSI),25 W.43rd St.,4th Floor,New York,NY 10036,http:/www.ansi.org.4Available from International Electrotechnical Commission(IEC),3 rue deVaremb,Case postale 131,CH-1211,Geneva 20,Switzerland,http:/www.iec.ch.Copyright ASTM Int
16、ernational,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 standard deviation of the intensity of the base material is ameasure of the noise.The CNR depends on the radiation doseand the DDA system properties.3.1.7 detector signal-to-noise rationormalized(dSNRn)the SNR is normalized for basic spatial resolution SRb asmeasured directly on the detector without any object other thanbeam filters in the beam path.3.1.8 digital detector array(DDA)systeman electronicdevi
