1、Designation:B100818Standard Test Method forStress-Strain Testing for Overhead Electrical Conductors1This standard is issued under the fixed designation B1008;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the year of last revision.A
2、 number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.1.Scope1.1 This test method covers the measurement of the elasticand short-term creep characteristics of conductors for overheadpower lines.1.2 Stres
3、s-strain data from tests performed in accordancewith IEC 61089 are compliant with this standard.1.3 Stress-strain data from prior Aluminum Associationtesting procedures are compliant with this standard.1.4 The values stated in either SI units or inch-pound unitsare to be regarded separately as stand
4、ard.The values stated ineach system may not be exact equivalents;therefore,eachsystem shall be used independently of the other.Combiningvalues from the two systems may result in non-conformancewith the standard.1.5 This standard does not purport to address all of thesafety concerns,if any,associated
5、 with its use.It is theresponsibility of the user of this standard to establish appro-priate safety,health,and environmental practices and deter-mine the applicability of regulatory limitations prior to use.1.6 This international standard was developed in accor-dance with internationally recognized
6、principles on standard-ization established in the Decision on Principles for theDevelopment of International Standards,Guides and Recom-mendations issued by the World Trade Organization TechnicalBarriers to Trade(TBT)Committee.2.Referenced Documents2.1 ASTM Standards:2E4 Practices for Force Verifica
7、tion of Testing MachinesE83 Practice for Verification and Classification of Exten-someter SystemsE220 Test Method for Calibration of Thermocouples ByComparison Techniques2.2 Aluminum Association Document:3Aluminum Association Guide for Stress-Strain and CreepTesting of Conductors,19992.3 IEC Documen
8、t:4IEC 61089:1991 Appendix B,Stress-strain Test Method3.Terminology3.1 Definitions:3.1.1 banding clamps,nany of several means for lockingtogether all strands of a conductor or core sample.3.1.2 composite conductor,na conductor made of twodistinct elements,a single wire or stranded core primarily use
9、dfor reinforcement or support and an outer stranded componentof a second,more conductive material.3.1.3 conductor stress-strain,nelastic and short-termcreep behavior of a conductor.3.1.4 creep,npermanent elongation of a material understress,for a given temperature and time.3.1.5 elastic strain,nelon
10、gation caused by stress that iscompletely recovered when the stress is released.3.1.6 final modulus,na linear relationship between stressand strain after the conductor has experienced its maximumstrain.3.1.7 gauge length(gauge section),nthe distance overwhich the strain is measured.3.1.8 gauge rod,n
11、the rigid frame used to set the gaugelength.3.1.9 homogeneous conductor,na conductor made of asingle wire or stranded using strands of the same material.3.1.10 initial modulus,na fitted curve through test datathat describes the expected behavior of the conductor duringloading.3.1.11 modulus of elast
12、icity(MOE,elastic modulus,E),nthe slope of the linear,elastic portions of the stress-straindata for a conductor or conductor component.1This test method is under the jurisdiction of ASTM Committee B01 onElectrical Conductors and is the direct responsibility of Subcommittee B01.02 onMethods of Test a
13、nd Sampling Procedure.Current edition approved Nov.1,2018.Published January 2019.DOI:10.1520/B1008-18.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Docum
14、ent Summary page onthe ASTM website.3Available from Aluminum Association,1400 Crystal Dr.,Suite 430,Arlington,VA 22202,http:/www.aluminum.org.4Available from International Electrotechnical Commission(IEC),3,rue deVaremb,1st Floor,P.O.Box 131,CH-1211,Geneva 20,Switzerland,http:/www.iec.ch.Copyright A
15、STM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United StatesThis international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for theDevelopment of International Standar
16、ds,Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade(TBT)Committee.1 3.1.11.1 virtual stress(for composite conductors),nstressin a conductor component multiplied by the area fraction ofthat component.3.1.12 one-hour creep,npermanent elongation of theconductor sample after holding it for an hour at various stresslevels.3.1.13 one-hour modulus,nsee initial modulus.3.1.14 plastic strain,npermanent deformation after thestress is removed.3.1.15 rated breaki
