1、CONTENTSPageFOREWORD.PREFACE INTRODUCTION9SECTION ONE-GENERALClauseI.Scope.92.Objeet.9SECTION TWO-MEASUREMENT OF DIRECT VOLTAGES3.General.4.Systems for measuring the steady-state value of direct voltages.5.Systems for measuring ripple voltage.1116.Determination of voltage ratios and scale factors.13
2、7.Determination of the amplitude-frequency response of a measuring system.138.Possible sources of error and precautions.13SECTION THREE-MEASUREMENT OF ALTERNATING VOLTAGES9.General.150.Systems for measuring the amplitude of alternating voltages.1511.Systems for measuring the amplitude of harmonics.1
3、712.Determination of voltage ratios and scale factors.1713.Determination of the amplitude-frequency response of a measuring system.1914.Possible sources of errors and precautions.19SECTION FOUR-MEASUREMENT OF IMPULSE VOLTAGES15.General.16.Measuring system components.16.1 Voltage divider.16.2 High vo
4、ltage lead.16.3 Damping resistor.6.4 Oscilloscope.16.5 Peak voltmeter.16.6 Coaxial cable and marching devices.16.7 Earth returns.17.Determination of voltage divider ratios and scale factors.18.Response of a measuring system.19.Experimental procedure for measuring the unit step response.20.Determinat
5、ion of the response parameters from step response oscillograms.20.1 Determination of the virtual starting point 0 and unit amplitude20.2 Determination of the response time T.20.3 Determination of the initial distortion time To20.4 Determination of the response time T,of the system without high volta
6、ge lead.20.5 Determination of the resonant frequency range.20.6 Determination of partial response time T.21.Determination of the response parameters by the sphere-gap method.21.1 Determination of the response time T.21.2 Determination of the partial response time T or Tu21.3 Determination of the res
7、ponse time T,of the system without high voltage lead.21.4 Determination of the resonant frequency range.22.Relation of response parameters to measuring errors.22.1 Errors caused byresponse time T.92113333332931133333327999444437122.2 Errors caused by partial response time T.22.3 Errors caused by ini
8、tial distortion time T.23.Criteria relating to corrections.23.1 Conditions for measurements to be sufficiently accurate without corrections.23.2 Conditions for correcting measurements and limits of application of the corrections.23.3 Procedures for cases when recorded oscillations exceed permitted l
9、evel.24.Evaluation of a measuring system by comparison method.-5-ClausePage25.Various sources of errors.precautions.4725.1 Divider ratio for long impulse duration.4725.2 Proximity effects.4925.3 Corona effects,precautions.4925.4 Disturbance level check.49SECTION FIVE-MEASUREMENT OF IMPULSE CURRENTS2
10、6.General.5127.Commonly used measuring systems.5127.1 Measuring system components.27.2 Step response of current measuring systems.5328.Precautions.55SECTION SIX-MEASURING ERRORS29.Statistical evaluation.55APPENDIx A-Resistor dividers.59APPENDIX B-Mathematical basis for response time T.61APPENDIX C-P
11、rocedure to determine if oscillations are present across the test object.6566FIGURES。INTERNATIONAL ELECTROTECHNICAL COMMISSIONHIGH-VOLTAGE TEST TECHNIQUESPart 4:Application guide for measuring devicesFOREWORD1)The formal decisions or agreements of the IEC on technical matters,prepared by Technical C
12、ommittees on which all theNational Committees having a special interest therein are represented,express.as nearly as possible.an internationalconsensus of opinion on the subjects dealt with.2)They have the form of recommendations for international use and they are accepted by the National Committees
13、 in thatsense.3)In order to promote international unification,the IEC expresses the wish that all National Committees should adopt thetext of the IEC recommendation for their national rules in so far as national conditions will permit.Any divergence betweenthe IEC recommendation and the correspondin
14、g national rules should.as far as possible,be clearly indicated in the latter.PREFACEThis standard has been prepared by IEC Technical Committee No.42.High-Voltage Testing Techniques.It constitutes a revision of that part of IEC Publication 60 which deals with measuring and calibration procedures whi
15、ch willsatisfy the specified requirements for accuracy.More specifically it replaces Section eight,the appendices and the technicalnotes of the IEC Publication 60.During a meeting in Bucharest in 1962.a general discussion was held concerning which modifications and addenda wereforeseen for IEC Publi
16、cation 60,then being printed.Subsequent drafts were circulated and discussed in Aix-les-Bains in 196-.in Tokyo in 1965,in London in 1968.in Leningrad in 1971 and in Ottawa in 1975.As a result of this latter meeting,a draft.Document 42(Central Office)27,was submitted to the National Committees for ap
17、proval under the Six Months Rule in April1976.The following countries voted explicitly in favour of publication:AustriaNorwayBelgiumPolandBrazilRomaniaCanadaSpainCzechoslovakiaSwedenDenmarkSwitzerlandEgyptTurkeyFranceUnion of SovietGermanySocialist RepublicsItalyUnited KingdomJapanUnited States of A
18、mericaKorea(Republic of)YugoslaviaOther IE C publications quoted in this standurd:Publications Nos.52:Recommendations for Voltage Measurement by Means of Sphere-gups(One Sphere Earthed).60-2:High-voltage Test Techniques,Part 2:Test Procedures.60-3:High-voltage Test Techniques.Part 3:Measuring Devices.186:Voltage Transformers.
