1、NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD60748-11QC 7901001990AMENDEMENT 2AMENDMENT 21999-04Amendement 2Dispositifs semiconducteurs Circuits intgrs Onzime partie:Spcification intermdiaire pour les circuitsintgrs semiconducteurs lexclusion des circuits hybridesAmendment 2Semiconductor devices In
2、tegrated circuitsPart 11:Sectional specification for semiconductorintegrated circuits excluding hybrid circuits Commission Electrotechnique Internationale International Electrotechnical CommissionPour prix,voir catalogue en vigueurFor price,see current catalogue IEC 1999 Droits de reproduction rserv
3、s Copyright-all rights reservedInternational Electrotechnical Commission 3,rue de Varemb Geneva,SwitzerlandTelefax:+41 22 919 0300 e-mail:inmailiec.ch IEC web site http:/www.iec.chCODE PRIXPRICE CODE CLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK
4、SUPPLY BUREAU.2 60748-11 amend.2 CEI:1999AVANT-PROPOSLe prsent amendement a t tabli par le sous-comit 47A:Circuits intgrs,du comitdtudes 47 de la CEI:Dispositifs semiconducteurs.Le texte de cet amendement est issu des documents suivants:FDISRapport de vote47A/536/FDIS47A/551/RVDLe rapport de vote in
5、diqu dans le tableau ci-dessus donne toute information sur le vote ayantabouti lapprobation de cet amendement._Page 24(voir lamendement 1)Tableau II Groupe A:Contrles lot par lotDans la note 3,ajouter ce qui suit:Dans un tel cas,lorsque lessai duplique celui dun autre sous-groupe,il na pas besoin dt
6、rerpt.Page 26(voir lamendement 1)Tableau III Groupe B:Contrles lot par lotSupprimer le texte existant de la note 4,qui est ambigu,et le remplacer par ce qui suit:La spcification particulire cadre peut diminuer lexigence des essais des sous-groupes A3,A3a et A3b celle dun seul sous-groupe.Page 28(voi
7、r amendement 1)Tableau IV Groupe C:Contrles priodiquesDans la colonne Conditions pour le sous-groupe C9,supprimer lindication Mthode 1 quinexiste pas et la remplacer par ce qui suit:Temps et temprature spcifier dans les spcifications intermdiaires et de dtail.LICENSED TO MECON Limited.-RANCHI/BANGAL
8、OREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.60748-11 Amend.2 IEC:1999 3 FOREWORDThis amendment has been prepared by subcommitee 47A:Integrated circuits,of IEC technicalcommittee 47:Semiconductor devices.The text of this amendment is based on the following documents:FDISR
9、eport on voting47A/536/FDIS47A/551/RVDFull information on the voting of the approval of this amendment can be found in the report onvoting indicated in the above table._Page 25(see amendment 1)Table II Group A:Lot-by-lotIn note 3,add the following:In such a case,where the test duplicates that of ano
10、ther subgroup,this test need not berepeated.Page 27(see amendment 1)Table III Group B:Lot-by-lotDelete the existing wording of note 4,which is ambiguous,and substitute the following:The blank detail specification can reduce the requirement for subgroup testing in A3,A3a andA3b to a minimum of one su
11、bgroup.Page 29(see amendment 1)Table IV Group C:Periodic testsUnder Details and conditions for subgroup C9,delete Method 1 which is non-existent,andsubstitute the following:Time and temperature to be specified either in the sectional or in the detail specification.LICENSED TO MECON Limited.-RANCHI/B
12、ANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.4 60748-11 amend.2 CEI:1999Page 34Tableau VII Exigences de prlvement pour les essais du Groupe ARemplacer le tableau existant par le nouveau tableau suivant:Sous-NQT(note 10)NQAgroupeCatgorie Catgorie CatgorieCatgorie ICat
13、gorie IICatgorie IIIIIIIIINCNQANCNQANCNQAA1733II1,0II0,4II0,4A210,70,7II0,15II0,1II0,1A2a33II0,4II0,4A2b33II0,4II0,4A3522II0,65II0,25II0,25A3a1033S41,5S40,4S40,4A3b2033S42,5S40,4S40,4A41055S41,5S40,65S40,65A4a77S41,0S41,0A4b77S41,0S41,0NOTE 10 Niveau de qualit tolr,avec un critre dacceptation maxima
14、l de 4._LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.60748-11 Amend.2 IEC:1999 5 Page 35Table VII Sampling requirements for Group A testsReplace the existing table by the following new table:Sub-LTPD(note 10)AQLgroupCategoryCategory
15、CategoryCategory ICategory IICategory IIIIIIIIIILAQLILAQLILAQLA1733II1,0II0,4II0,4A210,70,7II0,15II0,1II0,1A2a33II0,4II0,4A2b33II0,4II0,4A3522II0,65II0,25II0,25A3a1033S41,5S40,4S40,4A3b2033S42,5S40,4S40,4A41055S41,5S40,65S40,65A4a77S41,0S41,0A4b77S41,0S41,0NOTE 10 Lot Tolerance Percent Defective,wit
16、h a maximum acceptance number of 4._LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.ISBN 2-8318-4756-7?&1+,?;7:899?ICS 31.200Typeset and printed by the IEC Central OfficeGENEVA,SWITZERLANDLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.
