1、 CEI 60749-4(Premire dition 2002)DISPOSITIFS SEMICONDUCTEURS MTHODES DESSAIS MCANIQUESET CLIMATIQUES Partie 4:Essai continu fortement acclrde contrainte de chaleur humide(HAST)IEC 60749-4(First edition 2002)SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 4:Damp heat,steady state,high
2、lyaccelerated stress test(HAST)C O R R I G E N D U M 1Page 2Au lieu de:Le comit a dcid que le contenu decette publication ne sera pas modifiavant 2012.lire:Le comit a dcid que le contenu decette publication ne sera pas modifiavant 2007.Page 3Instead of:The committee has decided that thecontents of this publication will remainunchanged until 2012.read:The committee has decided that thecontents of this publication will remainunchanged until 2007.Aot 2003August 2003
