1、 IEC 61193-2Edition 1.0 2007-08INTERNATIONAL STANDARD Quality assessment systems Part 2:Selection and use of sampling plans for inspection of electronic components and packages IEC 61193-2:2007(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPL
2、Y BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission
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9、x:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.IEC 61193-2Edition 1.0 2007-08INTERNATIONAL STANDARD Quality assessment systems Part 2:Selection and use of sampling plans for inspection of electronic components and p
10、ackages INTERNATIONAL ELECTROTECHNICAL COMMISSION RICS 31.190 PRICE CODEISBN 2-8318-9297-XLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 61193-2 IEC:2007(E)CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normative references.6 3 Term
11、s and definitions.6 4 Sampling system.7 4.1 Formation and identification of lots.7 4.2 Drawing of samples.7 4.2.1 Selection of sample items.7 4.2.2 Process of sampling.7 4.3 Sampling plans.7 4.3.1 Inspection level.7 4.3.2 Sampling plan for normal inspection.8 4.3.3 Acceptance number.8 4.3.4 Tightene
12、d or reduced inspection.8 5 Acceptance and rejection.9 5.1 Acceptability criteria.9 5.2 Disposition of rejected lots.9 6 Statistical verified quality limit(SVQL).9 6.1 General.9 6.2 Calculation of the SVQL.10 Annex A(informative)Estimation of the statistical verified quality limit(SVQL)in nonconform
13、ing items per million(10-6)at a confidence limit 60%.11 Annex B(informative)Relationship between this standard and ISO 2859-1.15 Annex C(informative)Example of application of this standard(lot-by-lot inspection of assessment level EZ in IEC/TC 40).17 Bibliography.18 Table 1 Sample size.8 Table 2 Sam
14、ple size code letters.9 Table 3 Coefficients for confidence level 60%(see also A.5).10 Table A.1 Statistical verified quality limits in nonconforming items per million(10-6).12 Table A.2 np with confidence limit of 60%for accumulated number of non-conforming items and coefficient CL.14 Table B.1 Sam
15、pling plans corresponding to Table 2-A of ISO 2859-1.15 Table B.2 Tabulated values for operating characteristic curves(p:per cent nonconforming).16 Table C.1 Lot-by-lot inspection of assessment level EZ IEC/TC 40.17 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SU
16、PPLIED BY BOOK SUPPLY BUREAU.61193-2 IEC:2007(E)3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ QUALITY ASSESSMENT SYSTEMS Part 2:Selection and use of sampling plans for inspection of electronic components and packages FOREWORD 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardiz
