1、INTERNATIONAL IEC STANDARD 60679-1 Third edition2007-04 Quartz crystal controlled oscillators of assessed quality Part 1:Generic specification Reference number IEC 60679-1:2007(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUB
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8、9 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.INTERNATIONAL IEC STANDARD 60679-1 Third edition2007-04 Quartz crystal controlled oscillators of assessed quality Part 1:Generic specification XC Commission Electrotechnique Inter
9、nationaleInternational Electrotechnical Commission PRICE CODE For price,see current catalogueLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 60679-1 IEC:2007(E)CONTENTS FOREWORD.5 1 Scope.7 2 Normative references.7 3 Terms,definition
10、s and general information.9 3.1 General.9 3.2 Definitions.9 3.3 Preferred values for ratings and characteristics.19 3.4 Marking.21 4 Quality assessment procedures.21 4.1 Primary stage of manufacture.21 4.2 Structurally similar components.21 4.3 Subcontracting.22 4.4 Incorporated components.22 4.5 Ma
11、nufacturers approval.22 4.6 Approval procedures.22 4.7 Procedures for capability approval.23 4.8 Procedures for qualification approval.23 4.9 Test procedures.24 4.10 Screening requirements.24 4.11 Rework and repair work.24 4.12 Certified test records.24 4.13 Validity of release.24 4.14 Release for d
12、elivery.24 4.15 Unchecked parameters.25 5 Test and measurement procedures.25 5.1 General.25 5.2 Test and measurement conditions.25 5.3 Visual inspection.26 5.4 Dimensions and gauging procedures.27 5.5 Electrical test procedures.27 5.6 Mechanical and environmental test procedures.70 5.7 Endurance tes
13、t procedure.76 Annex A(normative)Load circuit for logic drive.78 Annex B(normative)Latch-up test.81 Annex C(normative)Electrostatic discharge sensitivity classification.82 Bibliography.83 Figure 1 Example of the use of frequency offset.11 Figure 2 Typical frequency fluctuation characteristics.14 Fig
14、ure 3 Characteristics of an output waveform.16 Figure 4 Clock signal with phase jitter.17 Figure 5 Phase jitter measures.17 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.60679-1 IEC:2007(E)3 Figure 6 Gaussian distribution of jitter.1
15、8 Figure 7 Jitter amplitude and period of jitter frequency.18 Figure 8 Jitter tolerance according to ITU-T G.825,ANSI T1.105.03,Telcordia GR-253 and ETSI EN 300462.19 Figure 9 Test circuits for insulation resistance measurements.27 Figure 10 Test circuit for voltage proof test.28 Figure 11 Test circ
16、uit for oscillator input power measurement.28 Figure 12 Test circuit for oven and oscillator input power measurement.29 Figure 13 Test circuit for measurement of output frequency,method1.30 Figure 14 Test circuit for measurement of output frequency,method 2.30 Figure 15 Test circuit for measurement of frequency/temperature characteristics.31 Figure 16 Thermal transient behaviour of typical oscillator.33 Figure 17 Generalized oscillator circuit.34 Figure 18 Test circuit for start-up behaviour and
