1、 CEI 60749-3(Premire dition 2002)DISPOSITIFS SEMICONDUCTEURS MTHODES DESSAIS MCANIQUESET CLIMATIQUES Partie 3:Examen visuel externeIEC 60749-3(First edition 2002)SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 3:External visual examinationC O R R I G E N D U M 1Page 2Au lieu de:Le co
2、mit a dcid que le contenu decette publication ne sera pas modifiavant 2012.lire:Le comit a dcid que le contenu decette publication ne sera pas modifiavant 2007.Page 3Instead of:The committee has decided that thecontents of this publication will remainunchanged until 2012.read:The committee has decided that thecontents of this publication will remainunchanged until 2007.Aot 2003August 2003
