1、 IEC 60749-43 Edition 1.0 2017-06 INTERNA TIONAL STA NDA RD NORME INTERNA TIONALE Semiconductor dev ices Mechanical and climatic test methods Part 43:Guidelines for IC reliability qualification plans Dispositifs semiconducteurs Mthodes dessais mcaniques et climatiques Partie 43:Lignes directrices co
2、ncernant les plans de qualification de la fiabilit des CI IEC 60749-43:2017-06(en-fr)colourinside THIS PUBLICA TION IS COPYRIGHT PROTECTED Copyright 2017 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no par t of this publication may be reproduced or utilized in any for m or b
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