1、NORMECEIINTERNATIONALEIECINTERNATIONAL61000-4-5STANDARDEdition 1.12001-04Edition 1:1995 consolidee par lamendement 1:2000Edition 1:1995 consolidated with amendment 1:2000PUBLICATION FONDAMENTALE EN CEMBASIC EMC PUBLICATIONCompatibilit lectromagntique(CEM)-Partie 4-5:Techniques dessai et de mesure-Es
2、sai dimmunite aux ondes de chocElectromagnetic compatibility(EMC)-Part 4-5:Testing and measurement techniques-Surge immunity test IEC 2001 Droits de reproduction rservs-Copyright-all rights reservedAucune partie de cette publication ne peut etre reproduite ni No part of this publication may be repro
3、duced or utilized inutilisee sous quelque forme que ce solt et par aucun procd，any form or by any means,electronic or mechanicalelectronique ou mcanique,y compris la photocopie et les including photocopying and microfilm,without permission inmicrofilms,sans lIaccord ecrit de Iediteur.writing from th
4、e publisher.Intenational Electrotechnical Commission3,rue de Varembe Geneva,SwitzerlandTelefax:+41229190300e-mail:inmailiec.chIEC web site http:/www.iec.chCommission Electrotechnique InternationaleCODE PRIXIECPRICE CODEWInternational Electrotechnical CommissionMemAyHapoAHaR neTpoTexHHecHaR OMHCCHRPo
5、ur prix,voir catalogue en vigueurFor price,see current catalogue61000-4-51EC:1995+A1:2000-3-CONTENTSPageFOREWORD.7INTRODUCTION.11Clause1 Scope and object.0132 Normative references.4133 General.153.1Switching transients.153.2 Lightning transients.153.3 Simulation of the transients.154 Definitions.176
6、 Test instrumentation.216.1 Combination wave(hybrid)generator(1,2/50 us-8/20 us).216.2Test generator 10/700 us according to CCITT.236.3Coupling/decoupling networks.257 Test set-up.317.Test 8quipment.317.2 Test set-up for tests applied to EUT power supply.,317.3 Test set-up for tests applied to unshi
7、elded unsymmetrically operatedinterconnection lines.317.4Test set-up for tests applied to unshielded symmetrically operatedinterconnection/telecommunication lines(figure 12).337.5 Test set-up for tests applied to shielded lines.337.6Test set-up to apply potential differences.337.7 Other test set-ups
8、.357.8 Test c0 nditions.358 Test procedure.358.1 Laboratory reference conditions.358.2 Application of the surge in the laboratory.359 Evaluation of test results.3918 Test report.39Annex A(normative)Selection of generators and test levels.63Annex B(informative)Explanatory notes.67Annex C(informative)
9、Bibliography.7761000-4-5IEC:1995+A1:2000-5-PageFigure 1-Simplified circuit diagram of the combination wave generator.41Figure 2-Waveform of open-circuit voltage(1,2/50 us).43Figure 3-Waveform of short-circuit current(8/20 us).43Figure 4-Simplified circuit diagram of the 10/700 us impulse generator.4
10、5Figure 5-Waveform of open-circuit voltage(10/700 us).47Figure 6-Example of test set-up for capacitive coupling on a.c./d.c.lines;line-to-line coupling(according to 7.2).49Figure 7-Example of test set-up for capacitive coupling on a.c./d.c.lines;line-to-earth coupling(according to 7.2).49Figure 8-Ex
11、ample of test set-up for capacitive coupling on a.c.lines(3 phases);line L3 to line L1 coupling(according to 7.2).51Figure 9-Example of test set-up for capacitive coupling on a.c.lines(3 phases);line L3 to earth coupling(according to 7.2);generator output earthed.5.3Figure 10-Example of test set-up
12、for unshielded interconnection lines;line-to-line/line-to-earth coupling(according to 7.3),coupling via capacitors.55Figure 11-Example of test set-up for unshielded unsymmetrically operated lines;line-to-line/line-to-earth coupling(according to 7.3),coupling via arrestors.57Figure 12-Example of test
13、 set-up for unshielded symmetrically operated lines(telecommunication lines);line-to-line/line-to-earth coupling(according to 7.4),coupling via arrestors.59Figure 13-Example of test set-up for tests applied to shielded lines(according to 7.5)and to apply potential differences(according to 7.6),condu
14、ctive coupling.61Figure 14-Example of test set-up for tests applied to unshielded linesand shielded lines earthed only at one end(according to 7.5)and to apply potential differences(according to 7.6),conductive coupling.61Figure B.1-Example for surge protection by shielding in buildingswith common e
15、arth reference system.73Figure B.2-Example for secondary surge protection in buildingswith separate common earth reference systems.73Figure B.3-Example for primary and secondary surge protectionof indoor-outdoor equipment.75Table 1-Test levels.21Table 2-Definitions of the waveform parameters 1,2/50
16、us.41Table 3-Definitions of the waveform parameters 10/700 us.45Table A.1-Selection of the test levels(depending on the installation conditions).6561000-4-5IEC:1995+A1:2000-7-INTERNATIONAL ELECTROTECHNICAL COMMISSIONELECTROMAGNETIC COMPATIBILITY(EMC)-Part 4-5:Testing and measurement techniques-Surge
17、 immunity testFOREWORD1)The IEC(International Electrotechnical Commission)is a worldwide organization for standardization comprisingall national electrotechnical committees(IEC National Committees).The object of the IEC is to promoteinternational co-operation on all questions concerning standardizat
18、ion in the electrical and electronic fields.Tothis end and in addition to other activities,the IEC publishes International Standards.Their preparation isentrusted to technical committees;any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work.Internati
19、onal,governmental and non-governmental organizations liaisingwith the IEC also participate in this preparation.The IEC collaborates closely with the InternationalOrganization for Standardization(ISO)in accordance with conditions determined by agreement between thetwo organizations.2)The formal decis
20、ions or agreements of the IEC on technical matters express,as nearly as possible,aninternational consensus of opinion on the relevant subjects since each technical committee has representationfrom all interested National Committees.3)The documents produced have the form of recommendations for intern
21、ational use and are published in the formof standards,technical specifications,technical reports or guides and they are accepted by the NationalCommittees in that sense.4)In order to promote international unification,IEC National Committees undertake to apply IEC InternationalStandards transparently
22、 to the maximum extent possible in their national and regional standards.Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.5)The IEC provides no marking procedure to indicate its approval and cannot be rendered responsi
23、ble for anyequipment declared to be in conformity with one of its standards.6)Attention is drawn to the possibility that some of the elements of this International Standard may be the subjectof patent rights.The IEC shall not be held responsible for identifying any or all such patent rights.Internat
24、ional Standard IEC 61000-4-5 has been prepared by subcommittee 65A:Systemaspects,of IEC technical committee 65:Industrial-process measurement and control.It forms section 5 of part 4 of IEC 61000.It has the status of a basic EMC publication inaccordance with IEC Guide 107.This consolidated version o
25、f IEC 61000-4-5 is based on the first edition(1995),documents65A(CO)41+77B(CO)25 and 65A/168/RVD and its amendment1(2000)documents77B/291+293/FDIS and 77B/298+300/RVD.It bears the edition number 1.1.A vertical line in the margin shows where the base publication has been modified bythe corrigendum an
26、d amendment 1.Annex A forms an integral part of this standard.Annexes B and C are for information only.61000-4-51EC:1995+A1:2000-9-The committee has decided that the contents of the base publication and its amendment 1 willremain unchanged until 2003.At this date,the publication will bereconfirmed:withdrawn;replaced by a revised edition,or。amended.
