1、FORM CDV(IEC)2005-09-23 17A/960/CDVCOMMITTEE DRAFT FOR VOTE(CDV)PROJET DE COMIT POUR VOTE(CDV)Project number 62271-101,Ed 2.0 Numro de projet IEC/TC or SC:SC 17A CEI/CE ou SC:Secretariat/Secrtariat Sweden Submitted for parallel voting in CENELEC Soumis au vote parallle au CENELEC Date of circulation
2、 Date de diffusion 2011-02-18 Closing date for voting(Voting mandatory for P-members)Date de clture du vote(Vote obligatoire pour les membres(P)2011-07-22 Also of interest to the following committees Intresse galement les comits suivants Supersedes document Remplace le document 17A/916/CD,17A/932/CC
3、 and item 7.2 of 17A/945/RM Functions concerned Fonctions concernes Safety Scurit EMC CEM Environment Environnement Quality assurance Assurance qualit CE DOCUMENT EST TOUJOURS LTUDE ET SUSCEPTIBLE DE MODIFICATION.IL NE PEUT SERVIR DE RFRENCE.LES RCIPIENDAIRES DU PRSENT DOCUMENT SONT INVITS PRSENTER,
4、AVEC LEURS OBSERVATIONS,LA NOTIFICATION DES DROITS DE PROPRIT DONT ILS AURAIENT VENTUELLEMENT CONNAISSANCE ET FOURNIR UNE DOCUMENTATION EXPLICATIVE.THIS DOCUMENT IS STILL UNDER STUDY AND SUBJECT TO CHANGE.IT SHOULD NOT BE USED FOR REFERENCE PURPOSES.RECIPIENTS OF THIS DOCUMENT ARE INVITED TO SUBMIT,
5、WITH THEIR COMMENTS,NOTIFICATION OF ANY RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE AND TO PROVIDE SUPPORTING DOCUMENTATION.Titre:CEI 62271-101:Appareillage haute tension-Partie 101:Essais synthtiques Title:IEC 62271-101:High-voltage switchgear and controlgear-Part 101:Synthetic testing Note dint
6、roduction Introductory note This document contains the changes made due to the addition of 1100 and 1200 kV.The changes made to document 17A/916/CD are highlighted by a vertical bar in the left margin.ATTENTION VOTE PARALLLE CEI CENELEC Lattention des Comits nationaux de la CEI,membres du CENELEC,es
7、t attire sur le fait que ce projet de comit pour vote(CDV)de Norme internationale est soumis au vote parallle.Les membres du CENELEC sont invits voter via le systme de vote en ligne du CENELEC.ATTENTION IEC CENELEC PARALLEL VOTING The attention of IEC National Committees,members of CENELEC,is drawn
8、to the fact that this Committee Draft for Vote(CDV)for an International Standard is submitted for parallel voting.The CENELEC members are invited to vote through the CENELEC online voting system.Copyright 2011 International Electrotechnical Commission,IEC.All rights reserved.It is permitted to downl
9、oad this electronic file,to make a copy and to print out the content for the sole purpose of preparing National Committee positions.You may not copy or mirror the file or printed version of the document,or any part of it,for any other purpose without permission in writing from IEC.62271-101 IEC:2011
10、 2 CONTENTS FOREWORD.91Scope.112Normative references.113Terms and definitions.114Synthetic testing techniques and methods for short-circuit breaking tests.134.1Basic principles and general requirements for synthetic breaking test methods.134.1.1High-current interval.134.1.2Interaction interval.144.1
11、.3High-voltage interval.144.2Synthetic test circuits and related specific requirements for breaking tests.154.2.1Current injection methods.154.2.2Voltage injection method.164.2.3Duplicate circuit method(transformer or Skeats circuit).174.2.4Other synthetic test methods.174.3Three-phase synthetic tes
12、t methods.175Synthetic testing techniques and methods for short-circuit making tests.205.1Basic principles and general requirements for synthetic making test methods.205.1.1High-voltage interval.215.1.2Pre-arcing interval.215.1.3Latching interval and fully closed position.215.2Synthetic test circuit
13、 and related specific requirements for making tests.215.2.1General.215.2.2Test circuit.215.2.3Specific requirements.216Specific requirements for synthetic tests for making and breaking performance related to the requirements of 6.102 through 6.111 of IEC 62271-100.22Annex A(informative)Current disto
14、rtion.43A.1Current distortion immediately prior to current zero.43A.2Current distortion during the high-current interval.44A.2.1Distortion during one loop of arcing related to a symmetrical current.44A.2.2Distortion in general case.45A.3Examples of estimation of the parameters of the distorted curre
15、nt.46A.3.1Symmetrical current test.46A.3.2Asymmetrical current test.48Annex B(informative)Current injection methods.58B.1Current injection.58B.1.1Current injection circuit with the voltage circuit in parallel with the test circuit-breaker(parallel circuit).58B.1.2Current injection circuit with the v
16、oltage circuit in parallel with the auxiliary circuit-breaker(series circuit).58B.2Determination of the interval of significant change of the arc voltage.58Annex C(informative)Voltage injection methods.62C.1Voltage injection circuit with the voltage circuit in parallel with the auxiliary circuit-breaker(series circuit).6217A/960/CDV62271-101 IEC:2011 3 C.2Voltage injection circuit with the voltage circuit in parallel with the test circuit-breaker.62Annex D(informative)Duplicate circuit(transform
