1、 IEC 61496-2 Edition 4.0 2020-07 INTERNATIONAL STANDARD Safety of machinery Electro-sensitive protective equipment Part 2:Particular requirements for equipment using active opto-electronic protective devices(AOPDs)IEC 61496-2:2020-07(en)colourinside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright
2、2020 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committ
3、ee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office Tel.:+41 22 919 02 11 3,ru
4、e de Varemb infoiec.ch CH-1211 Geneva 20 www.iec.ch Switzerland About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The tec
5、hnical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigendum or an amendment might have been published.IEC publications search-webstore.iec.ch/advsearchform The advanced search enables to find IEC publications by a variet
6、y of criteria(reference number,text,technical committee,).It also gives information on projects,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available online and o
7、nce a month by email.IEC Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:salesiec.ch.Electropedia-www.electropedia.org The worlds leading online dictionary on electrotechnology,
8、containing more than 22 000 terminological entries in English and French,with equivalent terms in 16 additional languages.Also known as the International Electrotechnical Vocabulary(IEV)online.IEC Glossary-std.iec.ch/glossary 67 000 electrotechnical terminology entries in English and French extracte
9、d from the Terms and Definitions clause of IEC publications issued since 2002.Some entries have been collected from earlier publications of IEC TC 37,77,86 and CISPR.IEC 61496-2 Edition 4.0 2020-07 INTERNATIONAL STANDARD Safety of machinery Electro-sensitive protective equipment Part 2:Particular re
10、quirements for equipment using active opto-electronic protective devices(AOPDs)INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 13.110;29.260.99 ISBN 978-2-8322-8452-0 Registered trademark of the International Electrotechnical Commission Warning!Make sure that you obtained this publication from an auth
11、orized distributor.colourinside 2 IEC 61496-2:2020 IEC 2020 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.7 3 Terms and definitions.8 4 Functional,design and environmental requirements.9 5 Testing.14 6 Marking for identification and safe use.40 7 Accompanying documents.41 Annex
12、 A(normative)Optional functions of the ESPE.42 Annex AA(informative)Type 2 AOPD periodic test configurations.46 Figure 1 Limit area for the protection against the risk of beam bypass.12 Figure 2 Limit of vertical and horizontal misalignment.13 Figure 3 Test piece at 45.18 Figure 4 Test piece at 90.1
13、8 Figure 5 Verifying sensing function by moving the test piece(TP)through the detection zone near the emitter,near the receiver/retro-reflector target and at the midpoint.19 Figure 6 Limit values for the effective aperture angle(EAA).21 Figure 7 Determination of the minimum detection capability.22 F
14、igure 8 Measuring method for EAA(direction).23 Figure 9 Prism test to measure EAA of each beam.25 Figure 10 EAA test using prism.26 Figure 11 Example of optical subsystem.27 Figure 12 Example of SMD LED Model.28 Figure 13 Example of intensity distribution of emitting element.28 Figure 14 Example of
15、emitter model with beams internally blocked by aperture stop.29 Figure 15 Example of receiving unit with off axis beam portion reflected internally on mechanical elements.29 Figure 16 Example of test piece inside model of optical subsystem with passing radiation on the receiver.30 Figure 17 Example
16、of emitting unit adjusted at the limit.31 Figure 18 Extraneous reflection test with mirror outside of limit area.32 Figure 19 AOPD misalignment test.34 Figure 20 Light interference test Direct method.36 Figure 21 Light interference test Test set-up with incandescent light source.37 Figure 22 Light interference test Test set-up with fluorescent light source.38 Figure 23 Light interference test Test set-up with flashing beaconlight source.39 Figure AA.1 Single beam sensing device.46 Figure AA.2 Se
