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IEC_TS_61169-1-51-2020.pdf

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1、 IEC TS 61169-1-51 Edition 1.0 2020-10 TECHNICAL SPECIFICATION Radio frequency connectors Part 1-51:Technical specification of electrical tests Uncertainty specification of frequency domain test for return loss IEC TS 61169-1-51:2020-10(en)colourinside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyrig

2、ht 2020 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Comm

3、ittee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office Tel.:+41 22 919 02 11 3

4、,rue de Varemb infoiec.ch CH-1211 Geneva 20 www.iec.ch Switzerland About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The

5、technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigendum or an amendment might have been published.IEC publications search-webstore.iec.ch/advsearchform The advanced search enables to find IEC publications by a var

6、iety of criteria(reference number,text,technical committee,).It also gives information on projects,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available online an

7、d once a month by email.IEC Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:salesiec.ch.Electropedia-www.electropedia.org The worlds leading online dictionary on electrotechnolo

8、gy,containing more than 22 000 terminological entries in English and French,with equivalent terms in 16 additional languages.Also known as the International Electrotechnical Vocabulary(IEV)online.IEC Glossary-std.iec.ch/glossary 67 000 electrotechnical terminology entries in English and French extra

9、cted from the Terms and Definitions clause of IEC publications issued since 2002.Some entries have been collected from earlier publications of IEC TC 37,77,86 and CISPR.IEC TS 61169-1-51 Edition 1.0 2020-10 TECHNICAL SPECIFICATION Radio frequency connectors Part 1-51:Technical specification of elect

10、rical tests Uncertainty specification of frequency domain test for return loss INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 33.120.30 ISBN 978-2-8322-8928-0 Registered trademark of the International Electrotechnical Commission Warning!Make sure that you obtained this publication from an authorized

11、distributor.colourinside 2 IEC TS 61169-1-51:2020 IEC 2020 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normative references.6 3 Terms and definitions.7 4 Units,symbols and dimensions.7 4.1 Units and symbols.7 5 Report characteristics.7 6 Return loss in frequency domain tests.7 6.1 Parameters.7 6.

12、2 General considerations.7 6.3 Test equipment.8 6.3.1 General requirement.8 6.3.2 VNA calibration uncertainty.8 6.3.3 Terminating load specification.9 6.3.4 Other test conditions.10 6.3.5 Total test uncertainty.10 Annex A(informative)Estimation of VNA uncertainty specifications from commercial stand

13、ard devices.11 A.1 Estimation from calibration certificate.11 A.2 Estimation from data/specification sheet.11 Bibliography.13 Figure 1 Graphical symbols.8 Figure 2 Graphical principle.8 Figure 3 VNA measurement model.8 IEC TS 61169-1-51:2020 IEC 2020 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ RAD

14、IO FREQUENCY CONNECTORS Part 1-51:Technical specification of electrical tests Uncertainty specification of frequency domain test for return loss FOREWORD 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all national electrotechnical commi

15、ttees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields.To this end and in addition to other activities,IEC publishes International Standards,Technical Specifications,Technical Repor

16、ts,Publicly Available Specifications(PAS)and Guides(hereafter referred to as“IEC Publication(s)”).Their preparation is entrusted to technical committees;any IEC National Committee interested in the subject dealt with may participate in this preparatory work.International,governmental and non-governmental organizations liaising with the IEC also participate in this preparation.IEC collaborates closely with the International Organization for Standardization(ISO)in accordance with conditions determ

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