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IEc_TS_62492-2-2013.pdf

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1、 IEC/TS 62492-2 Edition 1.0 2013-04 TECHNICAL SPECIFICATION Industrial process control devices Radiation thermometers Part 2:Determination of the technical data for radiation thermometers IEC/TS 62492-2:2013(E)colourinsideCopyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,d

2、ownloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utili

3、zed in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional ri

4、ghts to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office Tel.:+41 22 919 02 11 3,rue de Varemb Fax:+41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechn

5、ical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have t

6、he latest edition,a corrigenda or an amendment might have been published.Useful links:IEC publications search-www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,repla

7、ced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available on-line and also once a month by email.Electropedia-www.electropedia.org The worlds leading online dictionary of

8、electronic and electrical terms containing more than 30 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary(IEV)on-line.Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedba

9、ck on this publication or need further assistance,please contact the Customer Service Centre:csciec.ch.Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printe

10、d.IEC/TS 62492-2 Edition 1.0 2013-04 TECHNICAL SPECIFICATION Industrial process control devices Radiation thermometers Part 2:Determination of the technical data for radiation thermometers INTERNATIONAL ELECTROTECHNICAL COMMISSION U ICS 17.200.20;25.040.40 PRICE CODE ISBN 978-2-83220-737-6 Registere

11、d trademark of the International Electrotechnical Commission Warning!Make sure that you obtained this publication from an authorized distributor.colourinsideCopyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-27-2014 by James Madison.No further reproduction

12、 or distribution is permitted.Uncontrolled when printed.2 TS 62492-2 IEC:2013(E)CONTENTS FOREWORD.4 1 Scope.6 2 Normative references.6 3 Terms,definitions and abbreviations.6 3.1 Terms and definitions.6 3.2 Abbreviations.9 4 Measurement conditions.9 5 Determination of technical data.9 5.1 Measuring

13、temperature range.9 5.1.1 General.9 5.1.2 Test method.10 5.2 Measurement uncertainty.10 5.2.1 General.10 5.2.2 Test method.10 5.3 Noise equivalent temperature difference(NETD).11 5.3.1 General.11 5.3.2 Test method.11 5.4 Measuring distance.12 5.5 Field-of-view(target size).12 5.5.1 General.12 5.5.2

14、Test method.13 5.6 Distance ratio.14 5.7 Size-of-source effect(SSE).14 5.7.1 General.14 5.7.2 Test method.14 5.8 Emissivity setting.15 5.9 Spectral range.15 5.10 Influence of the internal instrument or ambient temperature(temperature parameter).15 5.10.1 General.15 5.10.2 Test method.16 5.11 Influen

15、ce of air humidity(humidity parameter).17 5.12 Long-term stability.17 5.12.1 General.17 5.12.2 Test method.17 5.13 Short-term stability.18 5.13.1 General.18 5.13.2 Test method.18 5.14 Repeatability.18 5.14.1 General.18 5.14.2 Test method.19 5.15 Interchangeability.19 5.15.1 General.19 5.15.2 Test me

16、thod.19 5.16 Response time.20 5.16.1 General.20 5.16.2 Test method.21 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.TS 62492-2 IEC:2013(E)3 5.17 Exposure time.22 5.17.1 General.22 5.17.2 Test method.23 5.18 Warm-up time.24 5.18.1 General.24 5.18.2 Test method.24 5.19 Operating temperature and air humidity range.25 5.19.1 General.25 5.19.2 Te

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