1、 TECHNICAL REPORT IEC TR 61967-4-1 First edition2005-02 Integrated circuits Measurement of electromagnetic emissions,150 kHz to 1 GHz Part 4-1:Measurement of conducted emissions 1 /150 direct coupling method Application guidance to IEC 61967-4 Reference number IEC/TR 61967-4-1:2005(E)LICENSED TO MEC
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8、ease contact the Customer Service Centre:Email:custserviec.ch Tel:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.TECHNICAL REPORT IECTR 61967-4-1 First edition2005-02 Integrated circuits Measureme
9、nt of electromagnetic emissions,150 kHz to 1 GHz Part 4-1:Measurement of conducted emissions 1 /150 direct coupling method Application guidance to IEC 61967-4 PRICE CODE IEC 2005 Copyright-all rights reserved No part of this publication may be reproduced or utilized in any form or by any means,elect
10、ronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechnical Commission,3,rue de Varemb,PO Box 131,CH-1211 Geneva 20,SwitzerlandTelephone:+41 22 919 02 11 Telefax:+41 22 919 03 00 E-mail:inmailiec.ch Web:www.iec.ch X For pri
11、ce,see current catalogue Commission Electrotechnique InternationaleInternational Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 TR 61967-4-1 IEC:2005(E)CONTENTS FOREWORD.4 1 Scope.6 2 Normative references
12、.6 3 Terms and definitions.7 4 Splitting ICs into IC function modules.9 4.1 Background.9 4.2 Benefits.9 4.3 IC function modules.9 4.4 Example matrix for splitting ICs into IC function modules.14 5 Workflow to perform IC EMC emission tests.15 5.1 Emission test philosophy.15 5.2 Flowchart of performin
13、g emission tests.15 6 Test configurations for IC function modules.16 6.1 EMC test recommendations for IC function modules.16 6.2 Port selection guide.16 6.3 Test networks at selected ports.18 6.4 Supply selection guide.22 6.5 Test networks at selected supplies.23 6.6 Parameter initialization of IC f
14、unction modules for testing.24 6.7 Test parameter for performing conducted emission measurements.30 7 Test board layout recommendations.36 7.1 Common test board recommendations.36 7.2 150 network on 2 layer and multi layer PCB.36 7.3 1 network on 2 layer and multi-layer PCB.37 8 Test report.37 Annex
15、 A(normative)IEC 61967-4 test network modification.38 Annex B(informative)Trace impedance calculation.40 Annex C(informative)Examples for splitting ICs into IC function modules.42 Figure 1 Common definition of an IC function module.8 Figure 2 Flowchart of performing emission tests.15 Figure 3 Test n
16、etwork for IC function module line driver.18 Figure 4 Symmetrical line driver without termination(not required by bus system datasheet).18 Figure 5 Symmetrical line driver with termination required by bus system datasheet.19 Figure 6 Test network for IC function module line driver.19 Figure 7 Test network for IC function module high side driver.20 Figure 8 Test network for IC function module low side driver.21 Figure 9 Conducted emission measurement circuits for IC function module supply.23 Figu
