1、 IEC 62979 Edition 1.0 2017-08 INTERNA TIONAL STA NDA RD Photov oltaic modules Bypass diode Thermal runaway test IEC 62979:2017-08(en)Copyright International Electrotechnical Commission THIS PUBLICA TION IS COPYRIGHT PROTECTED Copyright 2017 IEC,Geneva,Switzerland All rights reserved.Unless otherwis
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11、ERNATIONAL ELECTROTECHNICAL COMMISSION ICS 27.160 ISBN 978-2-8322-4587-3 R egist er ed tr ademar k of t he Int er national Electr ot echnical Commission W arning!Make sure that y ou obtained this publication from an authorized distributor.Copyright International Electrotechnical Commission 2 IEC 629
12、79:2017 IEC 2017 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normative references.6 3 Terms and definitions.6 4 Thermal runaway test.7 4.1 Diode thermal runaway.7 4.2 Test conditions.8 4.3 Preparation of test specimen.8 4.4 Test equipment.9 4.5 Test procedure.10 5 Pass or fail criteria.12 6 Test
13、report.12 Figure 1 Illustration of how thermal runaway occurs.7 Figure 2 Circuit for measurement of Tlead and forward voltage.9 Figure 3 Circuit for flowing a forward current to the bypass diode.10 Figure 4 Circuit for applying a reverse bias voltage to the bypass diode.10 Figure 5 The typical patte
14、rn of thermal runaway.11 Figure 6 The pattern of non-thermal runaway.11 Copyright International Electrotechnical Commission IEC 62979:2017 IEC 2017 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PHOTOVOLTAIC MODULES BYPASS DIODE THERMAL RUNAWAY TEST FOREWORD 1)The International Electrotechnical Commi
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