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IEC_62361-100_Ed.1.pdf

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1、FORM CDV(IEC)2009-01-09 Registered trademark of the International Electrotechnical Commission 57/1191/CDV COMMITTEE DRAFT FOR VOTE(CDV)PROJET DE COMIT POUR VOTE(CDV)Project number Numro de projet IEC 62361-100 Ed.1 IEC/TC or SC:57 CEI/CE ou SC:Secretariat/Secrtariat Germany Submitted for parallel vo

2、ting in CENELEC Soumis au vote parallle au CENELEC Date of circulation Date de diffusion 2011-11-11 Closing date for voting(Voting mandatory for P-members)Date de clture du vote(Vote obligatoire pour les membres(P)2012-04-13 Also of interest to the following committees Intresse galement les comits s

3、uivants -Supersedes document Remplace le document 57/1078A/NP-57/1094/RVN Proposed horizontal standard Norme horizontale suggre Other TC/SCs are requested to indicate their interest,if any,in this CDV to the TC/SC secretary Les autres CE/SC sont requis dindiquer leur intrt,si ncessaire,dans ce CDV l

4、intention du secrtaire du CE/SC Functions concerned Fonctions concernes Safety Scurit EMC CEM Environment Environnement Quality assurance Assurance qualit CE DOCUMENT EST TOUJOURS LTUDE ET SUSCEPTIBLE DE MODIFICATION.IL NE PEUT SERVIR DE RFRENCE.LES RCIPIENDAIRES DU PRSENT DOCUMENT SONT INVITS PRSEN

5、TER,AVEC LEURS OBSERVATIONS,LA NOTIFICATION DES DROITS DE PROPRIT DONT ILS AURAIENT VENTUELLEMENT CONNAISSANCE ET FOURNIR UNE DOCUMENTATION EXPLICATIVE.THIS DOCUMENT IS STILL UNDER STUDY AND SUBJECT TO CHANGE.IT SHOULD NOT BE USED FOR REFERENCE PURPOSES.RECIPIENTS OF THIS DOCUMENT ARE INVITED TO SUB

6、MIT,WITH THEIR COMMENTS,NOTIFICATION OF ANY RELEVANT PATENT RIGHTS OF WHICH THEY ARE AWARE AND TO PROVIDE SUPPORTING DOCUMENTATION.Titre:CEI 62361-100 Ed.1.0:Harmonisation des codes qualit travers le CE 57 Partie 100:Rgles de dsignation et de conception dans la mise en correspondance des profils CIM

7、 avec les schmas XML Title:IEC 62361-100 Ed.1.0:Harmonization of quality codes across TC 57 Part 100:Naming and design rules for CIM profiles to XML schema mapping Note dintroduction Introductory note ATTENTION VOTE PARALLLE CEI CENELEC Lattention des Comits nationaux de la CEI,membres du CENELEC,es

8、t attire sur le fait que ce projet de comit pour vote(CDV)de Norme internationale est soumis au vote parallle.Les membres du CENELEC sont invits voter via le systme de vote en ligne du CENELEC.ATTENTION IEC CENELEC PARALLEL VOTING The attention of IEC National Committees,members of CENELEC,is drawn

9、to the fact that this Committee Draft for Vote(CDV)for an International Standard is submitted for parallel voting.The CENELEC members are invited to vote through the CENELEC online voting system.Copyright 2011 International Electrotechnical Commission,IEC.All rights reserved.It is permitted to downl

10、oad this electronic file,to make a copy and to print out the content for the sole purpose of preparing National Committee positions.You may not copy or mirror the file or printed version of the document,or any part of it,for any other purpose without permission in writing from IEC.62361-100/CDV IEC

11、201X(E)1 TABLE OF CONTENTS 1 1 Scope.5 2 2 System Context.5 3 3 References.5 4 3.1 Normative References.6 5 3.2 Non-Normative References.6 6 4 Notation and Terminology.6 7 4.1 Contextual Model Definitions.6 8 4.2 XML Schema Representation.9 9 4.3 Namespaces.10 10 5 Mappings.10 11 5.1 Profiles.10 12

12、5.2 Structured and Compound Classes.12 13 5.3 Simple Properties.13 14 5.4 Object Properties.14 15 5.5 Exclusive Property Group.17 16 5.6 Compound Properties.18 17 5.7 Basic Types.18 18 5.8 Simple Types.19 19 5.9 DataTypes.21 20 5.10 Enumeration Classes.22 21 5.11 CodeList Classes.23 22 5.12 Document

13、ation.24 23 5.13 Names.25 24 5.14 Mapping Order.25 25 5.15 Changing Name Rules.25 26 6 Appendix:UN/CEFACT Conformance.26 27 6.1 Conformance.26 28 6.2 Non Conformance.27 29 7 Appendix:Profile Model Representations.28 30 31 32 62361-100/CDV IEC 201X(E)2 *INTERNATIONAL ELECTROTECHNICAL COMMISSION 33 _

14、34 35 Naming and Design Rules for CIM Profiles to XML Schema Mapping 36 37 IEC 62361-Part 100 38 39 40 FOREWORD 41 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all 42 national electrotechnical committees(IEC National Committees).The o

15、bject of IEC is to promote international co-43 operation on all questions concerning standardization in the electrical and electronic fields.To this end and in addition 44 to other activities,IEC publishes International Standards,Technical Specifications,Technical Reports,Publicly 45 Available Speci

16、fications(PAS)and Guides(hereafter referred to as“IEC Publication(s)”).Their preparation is 46 entrusted to technical committees;any IEC National Committee interested in the subject dealt with may participate in 47 this preparatory work.International,governmental and non-governmental organizations liaising with the IEC also 48 participate in this preparation.IEC collaborates closely with the International Organization for Standardization(ISO)in 49 accordance with conditions determined by agreeme

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