1、 INTERNATIONAL STANDARD IEC62539 First edition2007-07 IEEE 930Guide for the statistical analysis of electrical insulation breakdown data Reference number IEC 62539(E):2007 IEEE Std 930-2004 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BURE
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10、 BOOK SUPPLY BUREAU.Guide for the statistical analysis of electrical insulation breakdown data INTERNATIONAL STANDARD IEC62539 First edition2007-07 IEEE 930Commission Electrotechnique InternationaleInternational Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE
11、AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.1.Scope.82.References.83.Steps required for analysis of breakdown data.93.1 Data acquisition.93.2 Characterizing data using a probability function.103.3 Hypothesis testing.114.Probability distributions for failure data.124.1 The Weibull distributi
12、on.124.2 The Gumbel distribution.134.3 The lognormal distribution.134.4 Mixed distributions.134.5 Other terminology.145.Testing the adequacy of a distribution.145.1 Weibull probability data.145.2 Use of probability paper for the three-parameter Weibull distribution.155.3 The shape of a distribution
13、plotted on Weibull probability paper.165.4 A simple technique for testing the adequacy of the Weibull distribution.166.Graphical estimates of Weibull parameters.177.Computational techniques for Weibull parameter estimation.177.1 Larger data sets.177.2 Smaller data sets.188.Estimation of Weibull perc
14、entiles.199.Estimation of confidence intervals for the Weibull function.199.1 Graphical procedure for complete and censored data.209.2 Plotting confidence limits.2110.Estimation of the parameter and their confidence limits of the log-normal function.2110.1 Estimation of lognormal parameters.2110.2 E
15、stimation of confidence intervals of log-normal parameters.2211.Comparison tests.2211.1 Simplified method to compare percentiles of Weibull distributions.2312.Estimating Weibull parameters for a system using data from specimens.23IEEE Introduction.7 FOREWORD.4 CONTENTSIEC 62539:2007(E)IEEE 930-2004(
16、E)2 Published by IEC under licence from IEEE.2004 IEEE.All rights reserved.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.Annex A(informative)Least squares regression.24Annex B(informative)Bibliography.48 Published by IEC under licence from IEEE.2004 IEEE.All rights reserved.Annex C(informative)List of participants.49IEC 62539:2007(E)IEEE 930-2004(E)3 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONL
