ImageVerifierCode 换一换
格式:PDF , 页数:24 ,大小:969.17KB ,
资源ID:235134      下载积分:10 积分
快捷下载
登录下载
邮箱/手机:
温馨提示:
快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。 如填写123,账号就是123,密码也是123。
特别说明:
请自助下载,系统不会自动发送文件的哦; 如果您已付费,想二次下载,请登录后访问:我的下载记录
支付方式: 支付宝扫码支付 微信扫码支付   
验证码:   换一换

加入VIP,免费下载
 

温馨提示:由于个人手机设置不同,如果发现不能下载,请复制以下地址【https://www.wnwk.com/docdown/235134.html】到电脑端继续下载(重复下载不扣费)。

已注册用户请登录:
账号:
密码:
验证码:   换一换
  忘记密码?
三方登录: QQ登录  

下载须知

1: 本站所有资源如无特殊说明,都需要本地电脑安装OFFICE2007和PDF阅读器。
2: 试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。
3: 文件的所有权益归上传用户所有。
4. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。
5. 本站仅提供交流平台,并不能对任何下载内容负责。
6. 下载文件中如有侵权或不适当内容,请与我们联系,我们立即纠正。
7. 本站不保证下载资源的准确性、安全性和完整性, 同时也不承担用户因使用这些下载资源对自己和他人造成任何形式的伤害或损失。

版权提示 | 免责声明

本文(IEC_PAS_61338-1-5-2010.pdf)为本站会员(益****师)主动上传,蜗牛文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知蜗牛文库(发送邮件至admin@wnwk.com或直接QQ联系客服),我们立即给予删除!

IEC_PAS_61338-1-5-2010.pdf

1、 IEC/PAS 61338-1-5Edition 1.0 2010-05PUBLICLY AVAILABLE SPECIFICATIONPRE-STANDARD Waveguide type dielectric resonators Part 1-5:General information and test conditions Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency IEC/PAS 6133

2、8-1-5:2010(E)Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC,Geneva,Switzerland All rights

3、 reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If

4、you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office 3,rue de Varemb CH-1211 Geneva 20 Switzerland Email:inmailiec.ch

5、 Web:www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under

6、 constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,

7、).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electrop

8、edia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.c

9、h/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,d

10、ownloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC/PAS 61338-1-5Edition 1.0 2010-05PUBLICLY AVAILABLE SPECIFICATIONPRE-STANDARD Waveguide type dielectric resonators Part 1-5:General information and test conditions Measurement

11、method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency INTERNATIONAL ELECTROTECHNICAL COMMISSION RICS 31.140 PRICE CODEISBN 978-2-88910-935-7 Registered trademark of the International Electrotechnical Commission Copyrighted material licensed to BR

12、 Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.2 PAS 61338-1-5 IEC:2010(E)CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.8 3 Measurement and related parameters.8

13、4 Calculation equations for iR and i.9 5 Preparation of specimen.13 6 Measurement equipment and apparatus.13 6.1 Measurement equipment.13 6.2 Measurement apparatus.13 7 Measurement procedure.14 7.1 Set up of measurement equipment and apparatus.14 7.2 Measurement of reference level.14 7.3 Measurement

14、 procedure of uQ.14 7.4 Determination of i and measurement uncertainty.16 8 Example of measurement result.16 Annex A(informative)Derivation of equation(4)for iR.18 Annex B(informative)Calculation uncertainty of parameters in Figure 3.19 Bibliography.20 Figure 1 Surface resistance sR,surface conducti

15、vity s,interface resistance iR,and interface conductivity i.7 Figure 2 The 01TE mode dielectric rod resonator to measure i.9 Figure 3 Parameters chart of 0f,g,rodP and subP for reference sapphire rod.Calculation conditions:rod=9.4,d =10.00 mm and h=5.00 mm.11 Figure 4 Parameters chart of 0f,g,rodP a

16、nd subP for reference(Zr,Sn)TiO4 rod.Calculation conditions:rod=39,d=14.00 mm and h=6.46 mm.12 Figure 5 Schematic diagram of measurement equipments.13 Figure 6 Schematic diagram of measurement apparatus for ri.14 Figure 7 Frequency response for reference sapphire rod with two dielectric substrates as shown in figure 2.15 Figure 8 Resonance frequency 0f,insertion attenuation 0IA and half-power band width BWf.16 Table 1 Specifications of reference rods.10 Table 2 rod and rodtan of reference rod

copyright@ 2008-2023 wnwk.com网站版权所有

经营许可证编号:浙ICP备2024059924号-2