1、 IEC/PAS 61338-1-5Edition 1.0 2010-05PUBLICLY AVAILABLE SPECIFICATIONPRE-STANDARD Waveguide type dielectric resonators Part 1-5:General information and test conditions Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency IEC/PAS 6133
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10、ownloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC/PAS 61338-1-5Edition 1.0 2010-05PUBLICLY AVAILABLE SPECIFICATIONPRE-STANDARD Waveguide type dielectric resonators Part 1-5:General information and test conditions Measurement
11、method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency INTERNATIONAL ELECTROTECHNICAL COMMISSION RICS 31.140 PRICE CODEISBN 978-2-88910-935-7 Registered trademark of the International Electrotechnical Commission Copyrighted material licensed to BR
12、 Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.2 PAS 61338-1-5 IEC:2010(E)CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.8 3 Measurement and related parameters.8
13、4 Calculation equations for iR and i.9 5 Preparation of specimen.13 6 Measurement equipment and apparatus.13 6.1 Measurement equipment.13 6.2 Measurement apparatus.13 7 Measurement procedure.14 7.1 Set up of measurement equipment and apparatus.14 7.2 Measurement of reference level.14 7.3 Measurement
14、 procedure of uQ.14 7.4 Determination of i and measurement uncertainty.16 8 Example of measurement result.16 Annex A(informative)Derivation of equation(4)for iR.18 Annex B(informative)Calculation uncertainty of parameters in Figure 3.19 Bibliography.20 Figure 1 Surface resistance sR,surface conducti
15、vity s,interface resistance iR,and interface conductivity i.7 Figure 2 The 01TE mode dielectric rod resonator to measure i.9 Figure 3 Parameters chart of 0f,g,rodP and subP for reference sapphire rod.Calculation conditions:rod=9.4,d =10.00 mm and h=5.00 mm.11 Figure 4 Parameters chart of 0f,g,rodP a
16、nd subP for reference(Zr,Sn)TiO4 rod.Calculation conditions:rod=39,d=14.00 mm and h=6.46 mm.12 Figure 5 Schematic diagram of measurement equipments.13 Figure 6 Schematic diagram of measurement apparatus for ri.14 Figure 7 Frequency response for reference sapphire rod with two dielectric substrates as shown in figure 2.15 Figure 8 Resonance frequency 0f,insertion attenuation 0IA and half-power band width BWf.16 Table 1 Specifications of reference rods.10 Table 2 rod and rodtan of reference rod
