1、 TECHNICAL REPORT IEC TR 62240 First edition2005-06 Process management for avionics Use of semiconductor devices outside manufacturers specified temperature range Reference number IEC/TR 62240:2005(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK S
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8、x:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.TECHNICAL REPORT IECTR 62240 First edition2005-06 Process management for avionics Use of semiconductor devices outside manufacturers specified temperature range PRICE C
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11、SE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 TR 62240 IEC:2005(E)5 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.7 3 Terms and definitions.7 4 Objectives.10 5 Using devices outside the manufacturers specified temperature ranges.10 5.1 Device selection,usage and alt
12、ernatives.10 5.2 Device capability assessment.12 5.3 Device quality assurance in wider temperature ranges.15 5.4 Documentation.16 5.5 Device identification.16 Annex A(informative)Device parameter re-characterisation.19 A.1 Glossary of Symbols.19 A.2 Rationale for parameter re-characterisation.20 A.3
13、 Capability assurance.21 A.4 Quality assurance.28 A.5 Factors to be considered in parameter re-characterisation.28 A.6 References.30 Annex B(informative)Stress balancing.32 B.1 General.32 B.2 Glossary of symbols.32 B.3 Stress balancing.33 B.4 Application example.36 B.5 Other notes.39 Annex C(informa
14、tive)Parameter conformance assessment.42 C.1 General.42 C.2 Test plan.42 Annex D(informative)Higher assembly level testing.49 D.1 General.49 D.2 Process.49 Bibliography.52 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.TR 62240 IEC:20
15、05(E)3 Figure 1 Flow chart for semiconductor devices in wider temperature ranges.17 Figure 2 Report form for documenting device usage in wider temperature ranges.18 Figure A.1 Parameter re-characterisation.20 Figure A.2 Flow diagram of parameter re-characterisation capability assurance process.23 Fi
16、gure A.3 Margin in electrical parameter measurement based on the results of sample test.26 Figure A.4 Schematic diagram of parameter limit modifications.27 Figure A.5 Parameter Re-Characterisation Part Quality Assurance.28 Figure A.6 Schematic of outlier products that may invalidate sample testing.29 Figure A.7 Example of intermediate peak of an electrical parameter:voltage feedback input threshold change for Motorola MC34261 power factor controller 4.30 Figure A.8 Report form for documenting de