1、 TECHNICAL REPORT IEC TR 62240 First edition2005-06 Process management for avionics Use of semiconductor devices outside manufacturers specified temperature range Reference number IEC/TR 62240:2005(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK S
2、UPPLY BUREAU.Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series.For example,IEC 34-1 is now referred to as IEC 60034-1.Consolidated editions The IEC is now publishing consolidated versions of its publications.For example,edition number
3、s 1.0,1.1 and 1.2 refer,respectively,to the base publication,the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2.Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC,thus ensuri
4、ng that the content reflects current technology.Information relating to this publication,including its validity,is available in the IEC Catalogue of publications(see below)in addition to new editions,amendments and corrigenda.Information on the subjects under consideration and work in progress under
5、taken by the technical committee which has prepared this publication,as well as the list of publications issued,is also available from the following:IEC Web Site(www.iec.ch)Catalogue of IEC publications The on-line catalogue on the IEC web site(www.iec.ch/searchpub)enables you to search by a variety
6、 of criteria including text searches,technical committees and date of publication.On-line information is also available on recently issued publications,withdrawn and replaced publications,as well as corrigenda.IEC Just Published This summary of recently issued publications(www.iec.ch/online_news/jus
7、tpub)is also available by email.Please contact the Customer Service Centre(see below)for further information.Customer Service Centre If you have any questions regarding this publication or need further assistance,please contact the Customer Service Centre:Email:custserviec.ch Tel:+41 22 919 02 11 Fa
8、x:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.TECHNICAL REPORT IECTR 62240 First edition2005-06 Process management for avionics Use of semiconductor devices outside manufacturers specified temperature range PRICE C
9、ODE IEC 2005 Copyright-all rights reserved No part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechnical Commission,3,rue de Varemb,PO
10、 Box 131,CH-1211 Geneva 20,SwitzerlandTelephone:+41 22 919 02 11 Telefax:+41 22 919 03 00 E-mail:inmailiec.ch Web:www.iec.ch XA For price,see current catalogueCommission Electrotechnique InternationaleInternational Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL U
11、SE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 TR 62240 IEC:2005(E)5 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.7 3 Terms and definitions.7 4 Objectives.10 5 Using devices outside the manufacturers specified temperature ranges.10 5.1 Device selection,usage and alt
12、ernatives.10 5.2 Device capability assessment.12 5.3 Device quality assurance in wider temperature ranges.15 5.4 Documentation.16 5.5 Device identification.16 Annex A(informative)Device parameter re-characterisation.19 A.1 Glossary of Symbols.19 A.2 Rationale for parameter re-characterisation.20 A.3
13、 Capability assurance.21 A.4 Quality assurance.28 A.5 Factors to be considered in parameter re-characterisation.28 A.6 References.30 Annex B(informative)Stress balancing.32 B.1 General.32 B.2 Glossary of symbols.32 B.3 Stress balancing.33 B.4 Application example.36 B.5 Other notes.39 Annex C(informa
14、tive)Parameter conformance assessment.42 C.1 General.42 C.2 Test plan.42 Annex D(informative)Higher assembly level testing.49 D.1 General.49 D.2 Process.49 Bibliography.52 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.TR 62240 IEC:20
15、05(E)3 Figure 1 Flow chart for semiconductor devices in wider temperature ranges.17 Figure 2 Report form for documenting device usage in wider temperature ranges.18 Figure A.1 Parameter re-characterisation.20 Figure A.2 Flow diagram of parameter re-characterisation capability assurance process.23 Fi
16、gure A.3 Margin in electrical parameter measurement based on the results of sample test.26 Figure A.4 Schematic diagram of parameter limit modifications.27 Figure A.5 Parameter Re-Characterisation Part Quality Assurance.28 Figure A.6 Schematic of outlier products that may invalidate sample testing.29 Figure A.7 Example of intermediate peak of an electrical parameter:voltage feedback input threshold change for Motorola MC34261 power factor controller 4.30 Figure A.8 Report form for documenting de
