1、TECHNICALREPORTIEC TR 62014-3First edition2002-12Electronic design automation libraries Part 3:Models of integrated circuitsfor EMI behavioural simulationReference numberIEC/TR 62014-3:2002(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BU
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8、919 02 11Fax:+41 22 919 03 00LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.TECHNICALREPORTIECTR 62014-3First edition2002-12Electronic design automation libraries Part 3:Models of integrated circuitsfor EMI behavioural simulationPRICE
9、 CODE IEC 2002 Copyright-all rights reservedNo part of this publication may be reproduced or utilized in any form or by any means,electronic ormechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechnical Commission,3,rue de Varemb,PO
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11、AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 TR 62014-3 IEC:2002(E)CONTENTSFOREWORD.31Scope.51.1General.51.2Philosophy.62Normative references.73Definitions.74ICEM models description.84.1ICEM power-supply line model.84.2ICEM Input/output.94.3ICEM direct radiation.105ICEM models parts detail
12、s.115.1Passive parts parameters.115.2The current sources Ib and Ii/o.12Annex A Simulation tools implementation.14Figure 1 Mechanisms for parasitic emission covered by ICEM.5Figure 2 The basic mechanism for parasitic emission is due to the current drivingby all the gates.6Figure 3 Number of switching
13、 gates versus time.6Figure 4 Model of the IC supply lines.8Figure 5 Origin of primary and secondary resonance in the IC model.9Figure 6 Comparison between simulation and measurements(IEC 61967-4,1 method).9Figure 7 Coupling between core and I/Os.10Figure 8 Coupling between core and I/Os in the case
14、of separate supplies.10Figure 9 IC direct emissions measured in TEM cell.11Figure 10 Current source definition as a PWL description versus time.13Table 1 Value range of the model parameters.12LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BU
15、REAU.TR 62014-3 IEC:2002(E)3 INTERNATIONAL ELECTROTECHNICAL COMMISSION_ELECTRONIC DESIGN AUTOMATION LIBRARIES Part 3:Models of integrated circuitsfor EMI behavioural simulationFOREWORD1)The IEC(International Electrotechnical Commission)is a worldwide organization for standardization comprisingall na
16、tional electrotechnical committees(IEC National Committees).The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields.Tothis end and in addition to other activities,the IEC publishes International Standards.Their preparation isentrusted to technical committees;any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work.International,governmental and non-governmental
