1、CEI 60749-11(Premire dition 2002)Dispositifs semiconducteurs Mthodes dessais mcaniques et climatiques Partie 11:Variations rapides de temprature Mthode des deux bainsIEC 60749-11(First edition 2002)Semiconductor devices Mechanical and climatic test methods Part 11:Rapid change of temperature Two-flu
2、id-bath methodC O R R I G E N D U M 1Page 10Tableau 1 Tolrances de tempraturesde choc thermique et fluides suggrsSous A TempratureDans range Etape 2 Tolrance detempratureAu lieu de:40030,lire:40010.Page 11Table 1 Thermal shock temperaturetolerances and suggested fluidsUnder A TemperatureIn row Step 2 Temperature toleranceInstead of:40030,read:40010.Janvier 2003January 2003
