1、 INTERNATIONAL STANDARD IEC60444-7 First edition2004-04 Measurement of quartz crystal unit parameters Part 7:Measurement of activity and frequency dips of quartz crystal units Reference number IEC 60444-7:2004(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLI
2、ED BY BOOK SUPPLY BUREAU.Publication numberingAs from 1 January 1997 all IEC publications are issued with a designation in the60000 series.For example,IEC 34-1 is now referred to as IEC 60034-1.Consolidated editionsThe IEC is now publishing consolidated versions of its publications.For example,editi
3、on numbers 1.0,1.1 and 1.2 refer,respectively,to the base publication,thebase publication incorporating amendment 1 and the base publication incorporatingamendments 1 and 2.Further information on IEC publicationsThe technical content of IEC publications is kept under constant review by the IEC,thus
4、ensuring that the content reflects current technology.Information relating tothis publication,including its validity,is available in the IEC Catalogue ofpublications(see below)in addition to new editions,amendments and corrigenda.Information on the subjects under consideration and work in progress u
5、ndertakenby the technical committee which has prepared this publication,as well as the listof publications issued,is also available from the following:IEC Web Site(www.iec.ch)Catalogue of IEC publicationsThe on-line catalogue on the IEC web site(http:/www.iec.ch/searchpub/cur_fut.htm)enables you to
6、search by a variety of criteria including text searches,technicalcommittees and date of publication.On-line information is also available onrecently issued publications,withdrawn and replaced publications,as well ascorrigenda.IEC Just Published This summary of recently issued publications(http:/www.
7、iec.ch/online_news/justpub/jp_entry.htm)is also available by email.Please contact the CustomerService Centre(see below)for further information.Customer Service CentreIf you have any questions regarding this publication or need further assistance,please contact the Customer Service Centre:Email:custs
8、erviec.chTel:+41 22 919 02 11Fax:+41 22 919 03 00LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.INTERNATIONAL STANDARD IEC60444-7 First edition2004-04 Measurement of quartz crystal unit parameters Part 7:Measurement of activity and fr
9、equency dips of quartz crystal units IEC 2004 Copyright-all rights reserved No part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechni
10、cal Commission,3,rue de Varemb,PO Box 131,CH-1211 Geneva 20,SwitzerlandTelephone:+41 22 919 02 11 Telefax:+41 22 919 03 00 E-mail:inmailiec.ch Web:www.iec.ch H For price,see current cataloguePRICE CODE Commission Electrotechnique InternationaleInternational Electrotechnical Commission LICENSED TO ME
11、CON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 60444-7 IEC:2004(E)INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 7:Measurement of activity and frequency dips of quartz crystal units FOREWORD 1)The I
12、nternational Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and elect
13、ronic fields.To this end and in addition to other activities,IEC publishes International Standards,Technical Specifications,Technical Reports,Publicly Available Specifications(PAS)and Guides(hereafter referred to as“IEC Publication(s)”).Their preparation is entrusted to technical committees;any IEC
14、National Committee interested in the subject dealt with may participate in this preparatory work.International,governmental and non-governmental organizations liaising with the IEC also participate in this preparation.IEC collaborates closely with the International Organization for Standardization(I
15、SO)in accordance with conditions determined by agreement between the two organizations.2)The formal decisions or agreements of IEC on technical matters express,as nearly as possible,an international consensus of opinion on the relevant subjects since each technical committee has representation from
16、all interested IEC National Committees.3)IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense.While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate,IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user.4)In order to promote international uniformity,IEC National Committees undertake to apply IEC Publications tran