1、 INTERNATIONAL STANDARD IEC61788-7 Second edition2006-10 Superconductivity Part 7:Electronic characteristic measurements Surface resistance of superconductors at microwave frequencies Reference number IEC 61788-7:2006(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONL
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8、:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.INTERNATIONAL STANDARD IEC61788-7 Second edition2006-10 Superconductivity Part 7:Electronic characteristic measurements Surface resistance of superc
9、onductors at microwave frequencies IEC 2006 Copyright-all rights reserved No part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechnica
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11、N Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 61788-7 IEC:2006(E)CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.7 3 Terms and definitions.7 4 Requirements.7 5 Apparatus.8 5.1 Measurement system.8 5.2 Measurement apparatus for
12、Rs.9 5.3 Dielectric rods.11 6 Measurement procedure.12 6.1 Specimen preparation.12 6.2 Set-up.12 6.3 Measurement of reference level.12 6.4 Measurement of the frequency response of resonators.13 6.5 Determination of surface resistance of the superconductor and and tan of the standard sapphire rods.15
13、 7 Precision and accuracy of the test method.16 7.1 Surface resistance.16 7.2 Temperature.17 7.3 Specimen and holder support structure.17 7.4 Specimen protection.18 8 Test report.18 8.1 Identification of test specimen.18 8.2 Report of Rs values.18 8.3 Report of test conditions.18 Annex A(informative
14、)Additional information relating to Clauses 1 to 8.19 Bibliography.32 Figure 1 Schematic diagram of measurement system for temperature dependence of Rs using a cryocooler.8 Figure 2 Typical measurement apparatus for Rs.10 Figure 3 Insertion attenuation IA,resonant frequency f0 and half power bandwid
15、th f,measured at T Kelvin.13 Figure 4 Reflection scattering parameters(S11 and S22).15 Figure 5 Term definitions in Table 4.17 Figure A.1 Schematic configuration of several measurement methods for the surface resistance.20 Figure A.2 Configuration of a cylindrical dielectric rod resonator short-circ
16、uited at both ends by two parallel superconductor films deposited on dielectric substrates.22 Figure A.3 Computed results of the u-v and W-v relations for TE01p mode.23 Figure A.4 Configuration of standard dielectric rods for measurement of Rs and tan.24 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.61788-7 IEC:2006(E)3 Figure A.5 Three types of dielectric resonators.24 Figure A.6 Mode chart to design TE011 resonator short-circui
