1、 IEC TS 62916 Edition 1.0 2017-04 TECHNICAL SPECIFICATION Photov oltaic modules Bypass diode electrostatic discharge susceptibility testing IEC T S 62916:2017-04(en)colourinside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2017 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specifi
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10、your feedback on this publication or need fur ther assistance,plea se contact the Customer Ser v ice Centre:csciec.ch.IEC TS 62916 Edition 1.0 2017-04 TECHNICAL SPECIFICATION Photov oltaic modules By pass diode electrostatic discharge susceptibility testing INT ERNAT IONAL ELECT ROT ECHNICAL COMMISS
11、ION ICS 27.160 ISBN 978-2-8322-4147-9 Registered t rademark of the Internat ional Electrotechnica l Commission Warning!Mak e sure that you obtained this publication from an authorized distributor.colourinside 2 IEC TS 62916:2017 IEC 2017 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references.5 3 Terms
12、,definitions and abbreviated terms.5 4 General.6 5 Sampling.6 6 Test equipment.7 7 Test method.7 7.1 Preparation.7 7.2 Surge testing.8 8 Data analysis.8 8.1 Two-parameter Weibull distribution for analyzing voltage to failure.8 8.2 Recommended median rank estimation for the cumulative distribution.9
13、8.3 Recommended form for data analysis by least squares linear regression.9 9 Report.10 Annex A(informative)Guidelines for application.11 Annex B(informative)Example of application.12 Figure 1 Example of a test setup for bypass diodes.7 Figure B.1 Chart of sample data.12 Table 1 Data organization fo
14、r least squares regression.9 Table B.1 Example of data analysis.12 IEC TS 62916:2017 IEC 2017 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PHOTOVOLTAIC MODULES BYPASS DIODE ELECTROSTATIC DISCHARGE SUSCEPTIBILITY TESTING FOREWORD 1)The International Electrotechnical Commission(IEC)is a worldwide org
15、anization for standardization comprising all national electrotechnical committees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields.To this end and in addition to other activities,IE
16、C publishes International Standards,Technical Specifications,Technical Reports,Publicly Available Specifications(PAS)and Guides(hereafter referred to as“IEC Publication(s)”).Their preparation is entrusted to technical committees;any IEC National Committee interested in the subject dealt with may participate in this preparatory work.International,governmental and non-governmental organizations liaising with the IEC also participate in this preparation.IEC collaborates closely with the Internation
