收藏 分享(赏)

IEC_62526-2007_IEEE_1450.1.pdf

上传人:益****师 文档编号:236578 上传时间:2023-03-14 格式:PDF 页数:128 大小:1.66MB
下载 相关 举报
IEC_62526-2007_IEEE_1450.1.pdf_第1页
第1页 / 共128页
IEC_62526-2007_IEEE_1450.1.pdf_第2页
第2页 / 共128页
IEC_62526-2007_IEEE_1450.1.pdf_第3页
第3页 / 共128页
IEC_62526-2007_IEEE_1450.1.pdf_第4页
第4页 / 共128页
IEC_62526-2007_IEEE_1450.1.pdf_第5页
第5页 / 共128页
IEC_62526-2007_IEEE_1450.1.pdf_第6页
第6页 / 共128页
亲,该文档总共128页,到这儿已超出免费预览范围,如果喜欢就下载吧!
资源描述

1、 IEC 62526Edition 1.0 2007-11INTERNATIONAL STANDARD Standard for Extensions to Standard Test Interface Language(STIL)for Semiconductor Design Environments IEC 62526:2007(E)IEEE Std.1450.1-2005 IEEE 1450.1LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BO

2、OK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduc

3、ed or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rightsto this publication and oth

4、er information requests should be addressed to the IEC or your local IEC member National Committee.IEC Central Office The Institute of Electrical and Electronics Engineers,Inc 3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 US-New York,NY10016-5997 Switzerland USA Email:inmailiec.ch Email:stds-infoi

5、eee.org Web:www.iec.ch Web:www.ieee.org About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC pu

6、blications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,t

7、ext,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?E

8、lectropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer

9、Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNA

10、L USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.IEC 62526Edition 1.0 2007-11INTERNATIONAL STANDARD Standard for Extensions to Standard Test Interface Language(STIL)for Semiconductor Design Environments INTERNATIONAL ELECTROTECHNICAL COMMISSION XFICS 25.040 PRICE CODEISBN 2-8318-9348-8 IEE

11、E 1450.1LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.1.Overview.91.1 Scope.101.2 Purpose.112.Definitions,acronyms,and abbreviations.112.1 Definitions.112.2 Acronyms and abbreviations.123.Structure of this standard.124.STIL syntax de

12、scription.134.1 Reserved words.134.2 Reserved characters.144.3 Reserved UserFunctions.154.4 Signal and group name characteristics.154.5 STIL name spaces and name resolution.165.Expressions.175.1 Constant and variable expressions.175.2 Expression delimiterssingle quotes and parentheses.175.3 Arithmet

13、ic expressionsinteger,real,time,boolean.195.4 Pattern data expressions.205.5 Expression processing.215.6 Booleanboolean_expr.265.7 Integersinteger_expr.265.8 Logic expressionslogic_expr.275.9 Real expressionsreal_expr.285.10 Addition to timing expressionstime_expr.295.11 SignalVariablessigvar_expr.3

14、05.12 Formal parameters in procedures and macros.325.13 Integer listsinteger_list.326.Statement structure and organization of STIL information.337.STIL statement.337.1 STIL syntax.347.2 STIL example.348.UserKeywords statement.348.1 UserKeywords syntax.348.2 UserKeywords example.34IEC 62526:2007(E)IE

15、EE 1450.1-2005(E)2 IEEE Introduction.8FOREWORD.5CONTENTSPublished by IEC under licence from IEEE.2005 IEEE.All rights reserved.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.9.Variables block.359.1 Variables block syntax.359.2 Variabl

16、es example.379.3 Variables scoping.379.4 Variables synchronizing.3910.Signals block.4010.1 Signals block syntax.4010.2 Signals example.4010.3 Bracketed signal notation enhancement.4011.SignalGroups block.4311.1 SignalGroups syntax.4311.2 SignalGroups,WFCMap,and Variables example.4311.3 Default WFCMap attribute value.4411.4 Defining indexed signal groups.4412.PatternBurst block.4512.1 PatternBurst syntax.4512.2 PatternBurst example.4712.3 Tiling and synchronization of patterns.4812.4 If and While

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 专业资料 > 国外标准

copyright@ 2008-2023 wnwk.com网站版权所有

经营许可证编号:浙ICP备2024059924号-2