1、Designation:E223610(Reapproved 2015)Standard Test Methods forMeasurement of Electrical Performance and SpectralResponse of Nonconcentrator Multijunction PhotovoltaicCells and Modules1This standard is issued under the fixed designation E2236;the number immediately following the designation indicates
2、the year oforiginal adoption or,in the case of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.1.Scope1.1 These test methods provide special techniques needed to
3、determine the electrical performance and spectral response oftwo-terminal,multijunction photovoltaic(PV)devices,bothcell and modules.1.2 These test methods are modifications and extensions ofthe procedures for single-junction devices defined by TestMethods E948,E1021,and E1036.1.3 These test methods
4、 do not include temperature andirradiance corrections for spectral response and current-voltage(I-V)measurements.Procedures for such corrections are avail-able in Test Methods E948,E1021,and E1036.1.4 These test methods may be applied to cells and modulesintended for concentrator applications.1.5 Th
5、e values stated in SI units are to be regarded asstandard.No other units of measurement are included in thisstandard.1.6 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate s
6、afety and health practices and determine the applica-bility of regulatory limitations prior to use.2.Referenced Documents2.1 ASTM Standards:2E772 Terminology of Solar Energy ConversionE927 Specification for Solar Simulation for PhotovoltaicTestingE948 Test Method for Electrical Performance of Photov
7、ol-taic Cells Using Reference Cells Under Simulated Sun-lightE973 Test Method for Determination of the Spectral Mis-match Parameter Between a Photovoltaic Device and aPhotovoltaic Reference CellE1021 Test Method for Spectral Responsivity Measurementsof Photovoltaic DevicesE1036 Test Methods for Elec
8、trical Performance of Noncon-centrator Terrestrial Photovoltaic Modules and ArraysUsing Reference CellsE1040 Specification for Physical Characteristics of Noncon-centrator Terrestrial Photovoltaic Reference CellsE1125 Test Method for Calibration of Primary Non-Concentrator Terrestrial Photovoltaic R
9、eference Cells Us-ing a Tabular SpectrumE1328 Terminology Relating to Photovoltaic Solar EnergyConversion(Withdrawn 2012)3E1362 Test Method for Calibration of Non-ConcentratorPhotovoltaic Secondary Reference CellsG138 Test Method for Calibration of a SpectroradiometerUsing a Standard Source of Irrad
10、ianceG173 Tables for Reference Solar Spectral Irradiances:DirectNormal and Hemispherical on 37 Tilted Surface3.Terminology3.1 Definitionsdefinitions of terms used in this standardmay be found in Terminology E772 and in TerminologyE1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 multiju
11、nction device,na photovoltaic device com-posed of more than one photovoltaic junction stacked on top ofeach other and electrically connected in series.3.2.2 component cells,nthe individual photovoltaic junc-tions of a multijunction device.3.3 Symbols:1These test methods are under the jurisdiction of
12、 ASTM Committee E44 onSolar,Geothermal and Other Alternative Energy Sources and is the direct respon-sibility of SubcommitteeE44.09 on Photovoltaic Electric Power Conversion.Current edition approved March 1,2015.Published April 2015.Originallyapproved in 2002.Last previous edition approved in 2010 a
13、s E223610.DOI:10.1520/E2236-10R15.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page onthe ASTM website.3The last approved version of th
14、is historical standard is referenced onwww.astm.org.Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 C=reference cell calibration constant under the refer-ence spectrum,Am2W1Eo=total irradiance of reporting conditions,Wm2ES()=sourcespectra
15、lirradiance,Wm2nm1orWm2m1ER()=reference spectral irradiance,Wm2nm1orWm2m1FF=fill factor,dimensionlessi=subscript index associated with an individual com-ponent cellIo=current of test device under the reference spectrum,AI=current of test device under the source spectrum,AIsc=short-circuit current,AI
16、R=short-circuit current of reference cell under thesource spectrum,AM=spectral mismatch parameter,dimensionlessn=number of component cells in the multijunctiondevicePmax=maximum power,WQ()=quantum efficiency,dimensionlessR()=spectral response,AW1RT()=test device spectral response,AW1RR()=reference cell spectral response,AW1T=temperature,CVoc=open-circuit voltage,VVb=voltage applied by dc bias source,VZ=current balance,dimensionless=wavelength,nm or m4.Significance and Use4.1 In a series-connecte
