1、NORME INTERNATIONALECEIIECINTERNATIONALSTANDARD 61215Deuxime ditionSecond edition2005-04Modules photovoltaques(PV)au silicium cristallin pour application terrestre Qualification de la conception et homologation Crystalline silicon terrestrial photovoltaic(PV)modules Design qualification and type app
2、roval Numro de rfrence Reference number CEI/IEC 61215:2005 Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NORME INTERNATIONALECEIIECINTERNATIONALSTANDARD 61215Deuxime ditionS
3、econd edition2005-04Modules photovoltaques(PV)au silicium cristallin pour application terrestre Qualification de la conception et homologation Crystalline silicon terrestrial photovoltaic(PV)modules Design qualification and type approval Pour prix,voir catalogue en vigueur For price,see current cata
4、logue IEC 2005 Droits de reproduction rservs Copyright-all rights reservedAucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd,lectronique ou mcanique,y compris la photocopie et les microfilms,sans laccord crit de lditeur.No part of t
5、his publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechnical Commission,3,rue de Varemb,PO Box 131,CH-1211 Geneva 20,SwitzerlandTelephone:+41 22
6、919 02 11 Telefax:+41 22 919 03 00 E-mail:inmailiec.ch Web:www.iec.ch CODE PRIX PRICE CODE XCommission Electrotechnique InternationaleInternational Electrotechnical Commission?Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or n
7、etworking permitted without license from IHS-,-,-61215?IEC:2005 3 CONTENTS FOREWORD.71Scope and object.112Normative references.113Sampling.134Marking.135Testing.156Pass criteria.157Major visual defects.158Report.179Modifications.2310Test procedures.2310.1Visual inspection.2310.2Maximum power determi
8、nation.2310.3Insulation test.2510.4Measurement of temperature coefficients.2710.5Measurement of nominal operating cell temperature(NOCT).3310.6Performance at STC and NOCT.4910.7Performance at low irradiance.5110.8Outdoor exposure test.5310.9Hot-spot endurance test.5510.10UV preconditioning test.6510
9、.11Thermal cycling test.6710.12Humidity-freeze test.7110.13Damp-heat test.7310.14Robustness of terminations test.7510.15Wet leakage current test.7710.16Mechanical load test.7910.17Hail test.8110.18Bypass diode thermal test.87Annex A(informative)Changes in this second edition with respect to the firs
10、t edition of IEC 61215.91Figure 1 Qualification test sequence.19Figure 2 NOCT correction factor.45Figure 3 Reference plate.47Figure 4 NOCT measurement by reference plate method.47Figure 5 Wind correction factor.49Figure 6 Hot-spot effect in Type A cell.55Figure 7 Reverse characteristics.57Figure 8 H
11、ot-spot effect in type B cell.57Figure 9 Case SP:Series-parallel connection.59Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-61215?IEC:2005 5 Figure 10 Case SPS:series-parall
12、el-series connection.61Figure 11 Thermal cycling test.69Figure 12 Humidity-freeze cycle.73Figure 13 Hail-test equipment.83Figure 14 Impact locations illustrated.87Table 1 Summary of test levels.21Table 2 Ice-ball masses and test velocities.83Table 3 Impact locations.85Copyright International Electro
13、technical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-61215?IEC:2005 7 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CRYSTALLINE SILICON TERRESTRIAL PHOTOVOLTAIC(PV)MODULES DESIGN QUALIFICATION AND TYPE APPROVAL FO
14、REWORD 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardization in the electr
15、ical and electronic fields.To this end and in addition to other activities,IEC publishes International Standards,Technical Specifications,Technical Reports,Publicly Available Specifications(PAS)and Guides(hereafter referred to as“IEC Publication(s)”).Their preparation is entrusted to technical commi
16、ttees;any IEC National Committee interested in the subject dealt with may participate in this preparatory work.International,governmental and non-governmental organizations liaising with the IEC also participate in this preparation.IEC collaborates closely with the International Organization for Standardization(ISO)in accordance with conditions determined by agreement between the two organizations.2)The formal decisions or agreements of IEC on technical matters express,as nearly as possible,an i
