1、 IEC 60749-44 Edition 1.0 2016-07 INTER NA TIONA L STA NDA R D NOR ME INTER NA TIONA LE Semiconductor devices Mechanical and climatic test methods Part 44:Neutron beam irradiated single event effect(SEE)test method for semiconductor devices Dispositifs semiconducteurs Mthodes dessais mcaniques et cl
2、imatiques Partie 44:Mthode dessai des effets dun vnement isol(SEE)irradi par un faisceau de neutrons pour des dispositifs semiconducteurs IEC 60749-44:2016-07(en-fr)c olourinsideCopyright International Electrotechnical Commission THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC,Geneva,Swit
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