1、COMMISSION ELECTROTECHNIQUE INTERNATIONALENORME DE LA CEIINTERNATIONAL ELECTROTECHNICAL COMMISSIONIEC STANDARDPublication 158-2Premiere edition-First edition1982,Appareillage de commande a basse tensionDeuxieme partie:Contacteurs a semi-conducteurs(contacteurs statiques)Low-voltage controlgearPart 2
2、:Semiconductor contactors(solid state contactors)CEI1982Droits de reproduction rserves-Copyright-all rights reservedAucune partie de cette publication ne peut atre reproduite ni utilise sous quelque No part of this publication may be reproduced or utilized in any form or byforme que ce soit et par a
3、ucun prod.ectronique ou mecanique.y compris la any means.electronic or mechanical.including photocopying and microfilm.photocopie et les microfilms.sans Iaccord ecrit de editeur.without permission in writing from the publisher.Bureau Central de la Commission Electrotechnique Internationale3.rue de V
4、arembeIEC.Geneve.SuisseV0L.400es.88.一158-21EC19823一CONTENTSPageFOREWORD.,7PREFACE,7Clausel.General.,.91.1 Scope1.2Object。92.Definitions92.1 Definitions concerning contactors and semiconductor contactors.,.92.2 Definitions concerning states,control and auxiliary circuits of a semiconductor153.Classif
5、ication174.Characteristics of semiconductor contactors,174.1Summary of characteristics.,.,174.2Type of semiconductor contactor,.,.,.,194.3 Rated values.,194.4Control circuits.314.5Auxiliary circuits.,334.6Co-ordination with short-circuit protective devices,.,335.Nameplates356.Standard conditions for
6、 operation in service356.1 Normal service conditions,357.Standard conditions for construction,377.1 Mechanical design.377.2 Enclosures377.3Temperature rise.377.4Dielectric properties.,.417.5 Limiting values of operation418.Tests.418.1 Verification of the characteristics of semiconductor contactors41
7、8.2438.3 Routine tests18.4Special tests53APPENDIX A-Information to be given by the user when conditions for operation in servicediffer from the standard.。,65APPENDIX B-Clearances and creepage distances for low-voltage contactors(under consid-65APPENDIX C-Protection of a contactor by a short-circuit
8、protective device(under consid-65158-2IEC19825PageAPPENDIX D-Conventional test circuit for the verification of rated making and breakingcapacities of contactors.65APPENDIX E-Method of presenting a load diagram.67APPENDIX F-Test equipment and circuits for showering arc test.73158-2IEC19829LOW-VOLTAGE
9、 CONTROLGEARPart 2:Semiconductor contactors(solid state contactors)1.General1.1 ScopeThis standard applies to semiconductor contactors intended for performing electricaloperations by changing the state of electric circuits between on state and off state.This standard is additional to IEC Publication
10、 158-1:Low-voltage Controlgear,Part 1:Contactors(including Supplements A and B)which is applicable,provided it is not amendedby this standard.It applies only to semiconductor contactors,the main circuit of which is intended to beconnected to circuits,the rated voltage of which does not exceed 1 000
11、V a.c.or 1 500 V d.c.Notes 1.-Semiconductor contactors dealt with in this standard are not intended to provide short-circuit protectionof the main circuit,but may contain short-circuit protective devices for semiconductor parts.2.-Semiconductor motor-starters will be dealt with in a later publicatio
12、n.This standard applies also to hybrid semiconductor contactors,which are also covered by thescope of IEC Publication 158-1 as concerns their electromagnetic part.1.2 ObjectSee IEC Publication 158-1*.2.DefinitionsFor the purpose of this standard,the following definitions shall apply:2.1 Definitions
13、concerning contactors and semiconductor contactors2.1.1 Semiconductor switching deviceA switching device designed to make the current in an electric circuit by means of thecontrolled conductivity of a semiconductor.Note.-In a circuit where the current passes through zero(alternately or otherwise),th
14、e effect of not making thecurrent following such a zero value is equivalent to breaking the current.2.1.2 Mechanical switching deviceSee IEC Publication 158-1.*Whenever reference is made to IEC Publication 158-1,the clause with the same clause number applies,in someinstances modified by the text which follows,it being understood that the word contactor shall be replaced bysemiconductor contactor.
