1、 IEC 61445 Edition 1.0 2012-06 INTERNATIONAL STANDARD Digital Test Interchange Format(DTIF)IEC 61445:2012(E)IEEE Std 1445-1998 IEEE Std 1445 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution
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10、euters(Scientific),Inc.,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 61445 Edition 1.0 2012-06 INTERNATIONAL STANDARD Digital Test Interchange Format(DTIF)INTERNATIONAL ELECTROTECHNICAL COMMISSION XD ICS 25.040;35.060 P
11、RICE CODE ISBN 978-2-83220-105-3 Warning!Make sure that you obtained this publication from an authorized distributor.IEEE Std 1445 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permit
12、ted.Uncontrolled when printed.Contents 1.Overview.11.1 Scope.11.2 Purpose.11.3 Application.12.References.23.Denitions and acronyms.23.1 Denitions.23.2 Acronyms.44.Data organization overview of the DTIF standard environment.44.1 UUT Model Group.54.2 Stimulus and Response Group.54.3 Fault Dictionary G
13、roup.54.4 Probe Group.55.File specications.65.1 HEADER le.75.2 STIMULUS le.95.3 PO_RESPONSE le.105.4 PI_NAMES le.115.5 PO_NAMES le.125.6 MAIN_MODEL le.135.7 COMPONENT_TYPE le.145.8 USER_NODE le.155.9 INPUT_PIN_NAMES le.165.10 OUTPUT_PIN_NAMES le.175.11 NEAR_FROMS_POINTERS le.185.12 NEAR_FROMS le.195
14、.13 EVENT le.205.14 SETTLED_STATE_ONLY le.225.15 SETTLED_STATE_&_PULSES le.235.16 NODE_SOURCE le.255.17 STEPS le.265.18 F.D._POPATS le.275.19 F.D._FAULT_SIGNATURES le.285.20 F.D._PRINT_STRINGS le.305.21 TRISTATE_FROMS_POINTERS le.325.22 TRISTATE_FROMS le.335.23 PSEUDOPI_NAMES le.345.24 TIMING_SETS l
15、e.355.25 TIMING_PER_PATTERN le.375.26 PHASE_CONNECTIONS le.385.27 AUXILIARY_PIN_NAMES le.395.28 PI_FORMATS le.405.29 FORMAT_ATTRIBUTES le.41-ii-IEC 61445:2012 IEEE Std 1445-1998 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,downloaded on Nov-28-2014 by James Madison.No
16、 further reproduction or distribution is permitted.Uncontrolled when printed.5.30 F.D._CROSS_REFERENCE le.425.31 PROBETAG_ DEFINITIONS le.435.32 PROBETAG_ASSIGNMENTS le.455.33 BURSTS le.465.34 STIMULUS_TEXT le.475.35 NODE_NAMES le.485.36 EVENTS_INIT le.495.37 EQUIV_FAULTS le.515.38 PROBE_DETECTION le.525.39 F.D._EQUIV_SETS le.536.Conformance.546.1 End-to-end test.546.2 Diagnostic test using fault dictionary.546.3 Diagnostic test using probe.56Annex A(informative)Implementation overview.59Ann
